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Volumn , Issue , 2009, Pages 1027-1036

The twinning phenomenon in SnAgCu solder balls

Author keywords

[No Author keywords available]

Indexed keywords

3-DIMENSIONAL; ABRUPT CHANGE; AS-CAST; COOLING RATES; ELECTRON BACK SCATTER DIFFRACTION; FINE GRAINS; GRAIN ORIENTATION; GRAIN STRUCTURES; INDIVIDUAL FACTORS; LARGE-GRAIN; METALLIZATION SYSTEMS; METALLIZATIONS; MISORIENTATION ANGLE; ORIENTATION IMAGING MICROSCOPY; SMALL GRAINS; SNAGCU SOLDER; SOLDER ALLOYS; SOLDER BALLS; SOLDER JOINTS; SOLDER VOLUME;

EID: 70349668475     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2009.5074138     Document Type: Conference Paper
Times cited : (13)

References (11)
  • 3
    • 25844438737 scopus 로고    scopus 로고
    • Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications
    • Kang, S.K.; Choi, W.K.; Shi, D.-Y.; Henderson, D.W.; Puttlitz, K.J.: "Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications" Journal of Research and Development, Vol. 49, No. 4/5 (2005), pp. 607-619.
    • (2005) Journal of Research and Development , vol.49 , Issue.4-5 , pp. 607-619
    • Kang, S.K.1    Choi, W.K.2    Shi, D.-Y.3    Henderson, D.W.4    Puttlitz, K.J.5
  • 5
    • 0036710411 scopus 로고    scopus 로고
    • Orientation imaging studies of Sn-based electronic solder joints
    • Telang, A.U.; Bieler, T.R.; Choi, S.; Subramanian, K.N.: "Orientation imaging studies of Sn-based electronic solder joints" Journal of Material Research, Vol. 17, No. 9 (2002), pp. 2294-2306.
    • (2002) Journal of Material Research , vol.17 , Issue.9 , pp. 2294-2306
    • Telang, A.U.1    Bieler, T.R.2    Choi, S.3    Subramanian, K.N.4
  • 6
    • 33845568149 scopus 로고    scopus 로고
    • Influence of Sn grain size and orientation on the thermodynamical response and reliability of Pb-free solder joints
    • San Diego, CA, May 30 - June 2
    • Bieler, T.R.; Jiang, H.; Lehman, L.P.; Krikpatrick, T.; Cotts, E.J.: "Influence of Sn Grain Size and Orientation on the Thermodynamical Response and Reliability of Pb-free Solder Joints" Proc IEEE 56th Electronic Components and Technology Conference, San Diego, CA, May 30 - June 2 (2006), pp. 1462-1467.
    • (2006) Proc IEEE 56th Electronic Components and Technology Conference , pp. 1462-1467
    • Bieler, T.R.1    Jiang, H.2    Lehman, L.P.3    Krikpatrick, T.4    Cotts, E.J.5
  • 7
    • 51349163254 scopus 로고    scopus 로고
    • Scaling effects on grain size and texture of lead free interconnects ? investigations by electron backscatter diffraction and nanoindentation
    • Orlando, May 27 - May 30
    • Krause, M.; Mueller, M.; Petzold, M.; Wiese, M.; Wolter, K.-J.: "Scaling Effects on Grain Size and Texture of Lead Free Interconnects ? Investigations by Electron Backscatter Diffraction and Nanoindentation" Proc IEEE 58th Electronic Components and Technology Conference, Orlando, May 27 - May 30 (2008), pp. 75-81.
    • (2008) Proc IEEE 58th Electronic Components and Technology Conference , pp. 75-81
    • Krause, M.1    Mueller, M.2    Petzold, M.3    Wiese, M.4    Wolter, K.-J.5
  • 10
    • 33846618782 scopus 로고    scopus 로고
    • Creep of thermally aged SnAgCu solder joints
    • Wiese, S.; Wolter, K.-J.: "Creep of Thermally aged SnAgCu solder joints" Microelectronic Reliability, Vol. 47 (2007), pp. 223-232.
    • (2007) Microelectronic Reliability , vol.47 , pp. 223-232
    • Wiese, S.1    Wolter, K.-J.2
  • 11
    • 45949093528 scopus 로고    scopus 로고
    • The effect of downscaling the dimensions of solder interconnects on their creep properties
    • Wiese, S.; Roellig, M.; Mueller, M.; Wolter, K.-J.: "The effect of downscaling the dimensions of solder interconnects on their creep properties" Microelectronic Reliability, Vol. 48 (2008), pp. 843-850.
    • (2008) Microelectronic Reliability , vol.48 , pp. 843-850
    • Wiese, S.1    Roellig, M.2    Mueller, M.3    Wolter, K.-J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.