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1
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35348925915
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Effect of composition and cooling rate on the microstructure of SnAgCu-solder joints
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Reno, May 29 - June 1
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Mueller, M.; Wiese, S.; Wolter, K.-J.: "Effect of Composition and Cooling Rate on the Microstructure of SnAgCu-Solder Joints" Proc IEEE 57th Electronic Components and Technology Conference, Reno, May 29 - June 1 (2007), pp. 1579-1588.
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(2007)
Proc IEEE 57th Electronic Components and Technology Conference
, pp. 1579-1588
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Mueller, M.1
Wiese, S.2
Wolter, K.-J.3
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2
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85046983650
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Ag3sn plate formation in the solidification of near- ternary eutectic Sn-Ag-Cu
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Kang, S.K.; Lauro, P.A.; Shi, D.-Y.; Henderson, D.W.; Gosselin, T.; Sarkhel, A.; Goldsmith, C.; Puttlitz, K.J.: "Ag3Sn Plate Formation in the Solidification of Near- Ternary Eutectic Sn-Ag-Cu" Journal of Metals, Vol. 55, No. 6 (2006), pp. 61-65.
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(2006)
Journal of Metals
, vol.55
, Issue.6
, pp. 61-65
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Kang, S.K.1
Lauro, P.A.2
Shi, D.-Y.3
Henderson, D.W.4
Gosselin, T.5
Sarkhel, A.6
Goldsmith, C.7
Puttlitz, K.J.8
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3
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25844438737
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Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications
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Kang, S.K.; Choi, W.K.; Shi, D.-Y.; Henderson, D.W.; Puttlitz, K.J.: "Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications" Journal of Research and Development, Vol. 49, No. 4/5 (2005), pp. 607-619.
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(2005)
Journal of Research and Development
, vol.49
, Issue.4-5
, pp. 607-619
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Kang, S.K.1
Choi, W.K.2
Shi, D.-Y.3
Henderson, D.W.4
Puttlitz, K.J.5
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4
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19944429204
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Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
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Lehman, L.P.; Athavale, S.N.; Fullem, T.Z.; Giamis, A.C.; Kinyanjui, R.K.; Lowenstein, M.; Mather, K.; Patel, R.; Rae, D.; Wang, J.; Xing, Y.; Zavalij, L.; Borgesen, P.; Cotts, E.J.: "Growth of Sn and Intermetallic Compounds in Sn-Ag-Cu Solder" Journal of Electronic Materials, Vol. 33, No. 12 (2004), pp. 1429-1439.
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(2004)
Journal of Electronic Materials
, vol.33
, Issue.12
, pp. 1429-1439
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Lehman, L.P.1
Athavale, S.N.2
Fullem, T.Z.3
Giamis, A.C.4
Kinyanjui, R.K.5
Lowenstein, M.6
Mather, K.7
Patel, R.8
Rae, D.9
Wang, J.10
Xing, Y.11
Zavalij, L.12
Borgesen, P.13
Cotts, E.J.14
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5
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0036710411
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Orientation imaging studies of Sn-based electronic solder joints
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Telang, A.U.; Bieler, T.R.; Choi, S.; Subramanian, K.N.: "Orientation imaging studies of Sn-based electronic solder joints" Journal of Material Research, Vol. 17, No. 9 (2002), pp. 2294-2306.
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(2002)
Journal of Material Research
, vol.17
, Issue.9
, pp. 2294-2306
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Telang, A.U.1
Bieler, T.R.2
Choi, S.3
Subramanian, K.N.4
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6
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33845568149
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Influence of Sn grain size and orientation on the thermodynamical response and reliability of Pb-free solder joints
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San Diego, CA, May 30 - June 2
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Bieler, T.R.; Jiang, H.; Lehman, L.P.; Krikpatrick, T.; Cotts, E.J.: "Influence of Sn Grain Size and Orientation on the Thermodynamical Response and Reliability of Pb-free Solder Joints" Proc IEEE 56th Electronic Components and Technology Conference, San Diego, CA, May 30 - June 2 (2006), pp. 1462-1467.
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(2006)
Proc IEEE 56th Electronic Components and Technology Conference
, pp. 1462-1467
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Bieler, T.R.1
Jiang, H.2
Lehman, L.P.3
Krikpatrick, T.4
Cotts, E.J.5
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7
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51349163254
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Scaling effects on grain size and texture of lead free interconnects ? investigations by electron backscatter diffraction and nanoindentation
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Orlando, May 27 - May 30
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Krause, M.; Mueller, M.; Petzold, M.; Wiese, M.; Wolter, K.-J.: "Scaling Effects on Grain Size and Texture of Lead Free Interconnects ? Investigations by Electron Backscatter Diffraction and Nanoindentation" Proc IEEE 58th Electronic Components and Technology Conference, Orlando, May 27 - May 30 (2008), pp. 75-81.
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(2008)
Proc IEEE 58th Electronic Components and Technology Conference
, pp. 75-81
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Krause, M.1
Mueller, M.2
Petzold, M.3
Wiese, M.4
Wolter, K.-J.5
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8
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11344291942
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Grain- boundary character and grain growth in bulk tin and bulk lead -free solder alloys
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Telang, A.U.; Bieler, T.R.; Lucas, J.P.; Subramanian, K.N.; Lehman, L.P.; Xing, Y.; Cotts, E.J.: "Grain- Boundary Character and Grain Growth in Bulk Tin and Bulk Lead -Free Solder Alloys" Journal of Electronic Materials, Vol. 33, No. 12 (2004), pp. 1412-1423.
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(2004)
Journal of Electronic Materials
, vol.33
, Issue.12
, pp. 1412-1423
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Telang, A.U.1
Bieler, T.R.2
Lucas, J.P.3
Subramanian, K.N.4
Lehman, L.P.5
Xing, Y.6
Cotts, E.J.7
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9
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0036665771
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Interfacial reaction studies on lead (pb)-free solder alloys
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Kang, S. K.; Shi, D.Y.; Fogel, K.; Lauro, P.; Yim, M.-J.; Advocate Jr., G.G.; Griffin, M.; Goldsmith, C.; Henderson, D.W.; Gosselin, T.A.; King, D.E.; Konrad, J.J.; Sarkhel, A.; Puttlitz, K.J.: "Interfacial Reaction Studies on Lead (Pb)-Free Solder Alloys" IEEE Transactions on Electronics Packaging Manufacturing, Vol. 25, No. 3 (2002), pp. 155-161.
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(2002)
IEEE Transactions on Electronics Packaging Manufacturing
, vol.25
, Issue.3
, pp. 155-161
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Kang, S.K.1
Shi, D.Y.2
Fogel, K.3
Lauro, P.4
Yim, M.-J.5
Advocate Jr., G.G.6
Griffin, M.7
Goldsmith, C.8
Henderson, D.W.9
Gosselin, T.A.10
King, D.E.11
Konrad, J.J.12
Sarkhel, A.13
Puttlitz, K.J.14
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10
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33846618782
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Creep of thermally aged SnAgCu solder joints
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Wiese, S.; Wolter, K.-J.: "Creep of Thermally aged SnAgCu solder joints" Microelectronic Reliability, Vol. 47 (2007), pp. 223-232.
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(2007)
Microelectronic Reliability
, vol.47
, pp. 223-232
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Wiese, S.1
Wolter, K.-J.2
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11
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45949093528
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The effect of downscaling the dimensions of solder interconnects on their creep properties
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Wiese, S.; Roellig, M.; Mueller, M.; Wolter, K.-J.: "The effect of downscaling the dimensions of solder interconnects on their creep properties" Microelectronic Reliability, Vol. 48 (2008), pp. 843-850.
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(2008)
Microelectronic Reliability
, vol.48
, pp. 843-850
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Wiese, S.1
Roellig, M.2
Mueller, M.3
Wolter, K.-J.4
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