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Volumn , Issue , 2007, Pages 1579-1588

Effect of composition and cooling rate on the microstructure of SnAgCu-solder joints

Author keywords

[No Author keywords available]

Indexed keywords

INTERMETALLICS; JOINTS (STRUCTURAL COMPONENTS); OPTICAL MICROSCOPY; SOLDERING ALLOYS; SOLIDIFICATION;

EID: 35348925915     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2007.374006     Document Type: Conference Paper
Times cited : (39)

References (14)
  • 1
    • 25844438737 scopus 로고    scopus 로고
    • Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications
    • Kang, S.K.; Choi, W.K.; Shi, D.-Y.; Henderson, D.W.; Puttlitz, K.J.: "Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications" Journal of Research and Development, Vol. 49, No. 4/5 (2005), pp. 607-619.
    • (2005) Journal of Research and Development , vol.49 , Issue.4-5 , pp. 607-619
    • Kang, S.K.1    Choi, W.K.2    Shi, D.-Y.3    Henderson, D.W.4    Puttlitz, K.J.5
  • 2
    • 0942266959 scopus 로고    scopus 로고
    • Effects of Cooling Rate on the Microstructure and Tensile Behavior of a Sn-3.5wt.% Solder
    • Ochoa, F.; Williams, J.J.; Chawla, N.: "Effects of Cooling Rate on the Microstructure and Tensile Behavior of a Sn-3.5wt.% Solder" Journal of Electronic Materials, Vol. 32, No. 12 (2003), pp. 1414-1420.
    • (2003) Journal of Electronic Materials , vol.32 , Issue.12 , pp. 1414-1420
    • Ochoa, F.1    Williams, J.J.2    Chawla, N.3
  • 4
    • 0038688846 scopus 로고    scopus 로고
    • Growth and Selection of Intermetallic Species in Sn-Ag-Cu No-Pb Solder Systems based on Pad Metallurgies and Thermal Histories
    • New Orleans, May 27-30
    • Lehman, L.P.; Kinyanjui, R.K.; Zavalij, L.; Zribi, A.; Cotts, E.J.: "Growth and Selection of Intermetallic Species in Sn-Ag-Cu No-Pb Solder Systems based on Pad Metallurgies and Thermal Histories" Proc IEEE 53th Electronic Components and Technology Conference, New Orleans, May 27-30 (2003), pp. 1215-1221.
    • (2003) Proc IEEE 53th Electronic Components and Technology Conference , pp. 1215-1221
    • Lehman, L.P.1    Kinyanjui, R.K.2    Zavalij, L.3    Zribi, A.4    Cotts, E.J.5
  • 6
    • 24644437399 scopus 로고    scopus 로고
    • Aggarwal, Ankur O.; Raj, P. Markondeya; Sundaram, Venky; Ravi, D.; Koh, Sauwee; Mullapudi, Ravi; Tummala, Rao R.: 50 Micron Pitch Wafer Level Packaging Testbed with Reworkable IC-Package Nano Interconnects Proc IEEE 55th Electronic Components and Technology Conference, Orlando, May 31 - June 3 (2005), pp. 1139-1146.
    • Aggarwal, Ankur O.; Raj, P. Markondeya; Sundaram, Venky; Ravi, D.; Koh, Sauwee; Mullapudi, Ravi; Tummala, Rao R.: "50 Micron Pitch Wafer Level Packaging Testbed with Reworkable IC-Package Nano Interconnects" Proc IEEE 55th Electronic Components and Technology Conference, Orlando, May 31 - June 3 (2005), pp. 1139-1146.
  • 9
    • 42549116580 scopus 로고    scopus 로고
    • Influence of Cooling Rate and Composition on the Solidification of SnAgCu Solders
    • Dresden, Germany, September 5 -7
    • Mueller, M.; Wiese, S.; Wolter, K.-J.: "Influence of Cooling Rate and Composition on the Solidification of SnAgCu Solders", Proc 1st Electronic Systemintegration Technology Conference, Dresden, Germany, September 5 -7 (2006), pp. 1303-1311.
    • (2006) Proc 1st Electronic Systemintegration Technology Conference , pp. 1303-1311
    • Mueller, M.1    Wiese, S.2    Wolter, K.-J.3
  • 11
    • 0004246021 scopus 로고
    • neubearbeitete und erweiterte Auflage, Springer Berlin, Heidelberg
    • Haasen, P. Physikalische Metallkunde 3., neubearbeitete und erweiterte Auflage, Springer (Berlin, Heidelberg, 1994), pp. 188-212.
    • (1994) Physikalische Metallkunde 3 , pp. 188-212
    • Haasen, P.1
  • 13
    • 35348920328 scopus 로고    scopus 로고
    • Metallurgy division of the Material Science and Engineering Laboratory, Ag-Cu-Sn Phase Diagram & Computational Thermodynamics, http://www.metallurgy.nist.gov/phase/solder/agcusn.html, Date: 2007-02-25.
    • Metallurgy division of the Material Science and Engineering Laboratory, "Ag-Cu-Sn Phase Diagram & Computational Thermodynamics", http://www.metallurgy.nist.gov/phase/solder/agcusn.html, Date: 2007-02-25.
  • 14
    • 33845568149 scopus 로고    scopus 로고
    • Influence of Sn Grain Size and Orientation on the Thermodynamical Response and Reliability of Pb-free Solder Joints
    • San Diego, CA, May 30-June 2
    • Bieler, T.R.; Jiang, H.; Lehman, L.P.; Krikpatrick, T.; Cotts, EJ.: "Influence of Sn Grain Size and Orientation on the Thermodynamical Response and Reliability of Pb-free Solder Joints" Proc IEEE 56th Electronic Components and Technology Conference, San Diego, CA, May 30-June 2 (2006), pp. 1462-1467.
    • (2006) Proc IEEE 56th Electronic Components and Technology Conference , pp. 1462-1467
    • Bieler, T.R.1    Jiang, H.2    Lehman, L.P.3    Krikpatrick, T.4    Cotts, E.J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.