-
1
-
-
25844438737
-
Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications
-
Kang, S.K.; Choi, W.K.; Shi, D.-Y.; Henderson, D.W.; Puttlitz, K.J.: "Microstructure and mechanical properties of lead free solders and solder joints used in microelectronic applications" Journal of Research and Development, Vol. 49, No. 4/5 (2005), pp. 607-619.
-
(2005)
Journal of Research and Development
, vol.49
, Issue.4-5
, pp. 607-619
-
-
Kang, S.K.1
Choi, W.K.2
Shi, D.-Y.3
Henderson, D.W.4
Puttlitz, K.J.5
-
2
-
-
0942266959
-
Effects of Cooling Rate on the Microstructure and Tensile Behavior of a Sn-3.5wt.% Solder
-
Ochoa, F.; Williams, J.J.; Chawla, N.: "Effects of Cooling Rate on the Microstructure and Tensile Behavior of a Sn-3.5wt.% Solder" Journal of Electronic Materials, Vol. 32, No. 12 (2003), pp. 1414-1420.
-
(2003)
Journal of Electronic Materials
, vol.32
, Issue.12
, pp. 1414-1420
-
-
Ochoa, F.1
Williams, J.J.2
Chawla, N.3
-
3
-
-
0036665771
-
Interfacial Reaction Studies on Lead (Pb)-Free Solder Alloys
-
Kang, S. K.; Shi, D.Y.; Fogel, K.; Lauro, P.; Yim, M.-J.; Advocate, G.G. Jr.; Griffin, M.; Goldsmith, C.; Henderson, D.W.; Gosselin, T.A.; King, D.E.; Konrad, J.J.; Sarkhel, A.; Puttlitz, K.J.: "Interfacial Reaction Studies on Lead (Pb)-Free Solder Alloys" IEEE Transactions on Electronics Packaging Manufacturing, Vol. 25, No. 3 (2002), pp. 155-161.
-
(2002)
IEEE Transactions on Electronics Packaging Manufacturing
, vol.25
, Issue.3
, pp. 155-161
-
-
Kang, S.K.1
Shi, D.Y.2
Fogel, K.3
Lauro, P.4
Yim, M.-J.5
Advocate Jr., G.G.6
Griffin, M.7
Goldsmith, C.8
Henderson, D.W.9
Gosselin, T.A.10
King, D.E.11
Konrad, J.J.12
Sarkhel, A.13
Puttlitz, K.J.14
-
4
-
-
0038688846
-
Growth and Selection of Intermetallic Species in Sn-Ag-Cu No-Pb Solder Systems based on Pad Metallurgies and Thermal Histories
-
New Orleans, May 27-30
-
Lehman, L.P.; Kinyanjui, R.K.; Zavalij, L.; Zribi, A.; Cotts, E.J.: "Growth and Selection of Intermetallic Species in Sn-Ag-Cu No-Pb Solder Systems based on Pad Metallurgies and Thermal Histories" Proc IEEE 53th Electronic Components and Technology Conference, New Orleans, May 27-30 (2003), pp. 1215-1221.
-
(2003)
Proc IEEE 53th Electronic Components and Technology Conference
, pp. 1215-1221
-
-
Lehman, L.P.1
Kinyanjui, R.K.2
Zavalij, L.3
Zribi, A.4
Cotts, E.J.5
-
5
-
-
10444263718
-
Qualification of SnAg Solder Bumps for Lead-free Flip Chip Applications
-
Las Vegas, June 1-4
-
Ebersberger, B.; Bauer, R.; Alexa, L.: "Qualification of SnAg Solder Bumps for Lead-free Flip Chip Applications" Proc IEEE 54th Electronic Components and Technology Conference, Las Vegas, June 1-4 (2004), pp. 683-691.
-
(2004)
Proc IEEE 54th Electronic Components and Technology Conference
, pp. 683-691
-
-
Ebersberger, B.1
Bauer, R.2
Alexa, L.3
-
6
-
-
24644437399
-
-
Aggarwal, Ankur O.; Raj, P. Markondeya; Sundaram, Venky; Ravi, D.; Koh, Sauwee; Mullapudi, Ravi; Tummala, Rao R.: 50 Micron Pitch Wafer Level Packaging Testbed with Reworkable IC-Package Nano Interconnects Proc IEEE 55th Electronic Components and Technology Conference, Orlando, May 31 - June 3 (2005), pp. 1139-1146.
-
Aggarwal, Ankur O.; Raj, P. Markondeya; Sundaram, Venky; Ravi, D.; Koh, Sauwee; Mullapudi, Ravi; Tummala, Rao R.: "50 Micron Pitch Wafer Level Packaging Testbed with Reworkable IC-Package Nano Interconnects" Proc IEEE 55th Electronic Components and Technology Conference, Orlando, May 31 - June 3 (2005), pp. 1139-1146.
-
-
-
-
7
-
-
22944465234
-
Microstructure and Damage Evolution in Sn-Ag-Cu Solder Joints
-
Orlando, May 31, June 3
-
Lehman, L.P.; Kinyanjui, R.K.; Wang, J.; Xing, Y.; Zavalij, L.; Borgesen, P.; Cotts, E.J.: "Microstructure and Damage Evolution in Sn-Ag-Cu Solder Joints" Proc IEEE 55th Electronic Components and Technology Conference, Orlando, May 31 - June 3 (2005), pp. 674-681.
-
(2005)
Proc IEEE 55th Electronic Components and Technology Conference
, pp. 674-681
-
-
Lehman, L.P.1
Kinyanjui, R.K.2
Wang, J.3
Xing, Y.4
Zavalij, L.5
Borgesen, P.6
Cotts, E.J.7
-
8
-
-
42549124533
-
The Influence of Size and Composition on the Creep of SnAgCu Solder Joints
-
Dresden, Germany, September 5, 7
-
Wiese, S.; Roellig, M.; Mueller, M.; Rzepka, S.; Nocke, K.; Luhmann, C.; Kraemer, F.; Meier, K.; Wolter, K.-J.: "The Influence of Size and Composition on the Creep of SnAgCu Solder Joints", Proc 1st Electronic Systemintegration Technology Conference, Dresden, Germany, September 5 - 7 (2006), pp. 912-925.
-
(2006)
Proc 1st Electronic Systemintegration Technology Conference
, pp. 912-925
-
-
Wiese, S.1
Roellig, M.2
Mueller, M.3
Rzepka, S.4
Nocke, K.5
Luhmann, C.6
Kraemer, F.7
Meier, K.8
Wolter, K.-J.9
-
9
-
-
42549116580
-
Influence of Cooling Rate and Composition on the Solidification of SnAgCu Solders
-
Dresden, Germany, September 5 -7
-
Mueller, M.; Wiese, S.; Wolter, K.-J.: "Influence of Cooling Rate and Composition on the Solidification of SnAgCu Solders", Proc 1st Electronic Systemintegration Technology Conference, Dresden, Germany, September 5 -7 (2006), pp. 1303-1311.
-
(2006)
Proc 1st Electronic Systemintegration Technology Conference
, pp. 1303-1311
-
-
Mueller, M.1
Wiese, S.2
Wolter, K.-J.3
-
10
-
-
85046983650
-
Ag3Sn Plate Formation in the Solidification of Near-Ternary Eutectic Sn-Ag-Cu
-
Kang, S.K.; Lauro, P.A.; Shi, D.-Y.; Henderson, D.W.; Gosselin, T.; Sarkhel, A.; Goldsmith, C.; Puttlitz, K.J.: "Ag3Sn Plate Formation in the Solidification of Near-Ternary Eutectic Sn-Ag-Cu" Journal of Metals, Vol. 55, No. 6 (2006), pp. 61-65.
-
(2006)
Journal of Metals
, vol.55
, Issue.6
, pp. 61-65
-
-
Kang, S.K.1
Lauro, P.A.2
Shi, D.-Y.3
Henderson, D.W.4
Gosselin, T.5
Sarkhel, A.6
Goldsmith, C.7
Puttlitz, K.J.8
-
11
-
-
0004246021
-
-
neubearbeitete und erweiterte Auflage, Springer Berlin, Heidelberg
-
Haasen, P. Physikalische Metallkunde 3., neubearbeitete und erweiterte Auflage, Springer (Berlin, Heidelberg, 1994), pp. 188-212.
-
(1994)
Physikalische Metallkunde 3
, pp. 188-212
-
-
Haasen, P.1
-
12
-
-
19944429204
-
Growth of Sn and Intermetallic Compounds in Sn-Ag-Cu Solder
-
Lehman, L.P.; Athavale, S.N.; Fullem, T.Z.; Giamis, A.C.; Kinyanjui, R.K.; Lowenstein, M.; Mather, K.; Patel, R.; Rae, D.; Wang, J.; Xing, Y.; Zavalij, L.; Borgesen, P.; Cotts, EJ.: "Growth of Sn and Intermetallic Compounds in Sn-Ag-Cu Solder" Journal of Electronic Materials, Vol. 33, No. 12 (2004), pp. 1429-1439.
-
(2004)
Journal of Electronic Materials
, vol.33
, Issue.12
, pp. 1429-1439
-
-
Lehman, L.P.1
Athavale, S.N.2
Fullem, T.Z.3
Giamis, A.C.4
Kinyanjui, R.K.5
Lowenstein, M.6
Mather, K.7
Patel, R.8
Rae, D.9
Wang, J.10
Xing, Y.11
Zavalij, L.12
Borgesen, P.13
Cotts, E.J.14
-
13
-
-
35348920328
-
-
Metallurgy division of the Material Science and Engineering Laboratory, Ag-Cu-Sn Phase Diagram & Computational Thermodynamics, http://www.metallurgy.nist.gov/phase/solder/agcusn.html, Date: 2007-02-25.
-
Metallurgy division of the Material Science and Engineering Laboratory, "Ag-Cu-Sn Phase Diagram & Computational Thermodynamics", http://www.metallurgy.nist.gov/phase/solder/agcusn.html, Date: 2007-02-25.
-
-
-
-
14
-
-
33845568149
-
Influence of Sn Grain Size and Orientation on the Thermodynamical Response and Reliability of Pb-free Solder Joints
-
San Diego, CA, May 30-June 2
-
Bieler, T.R.; Jiang, H.; Lehman, L.P.; Krikpatrick, T.; Cotts, EJ.: "Influence of Sn Grain Size and Orientation on the Thermodynamical Response and Reliability of Pb-free Solder Joints" Proc IEEE 56th Electronic Components and Technology Conference, San Diego, CA, May 30-June 2 (2006), pp. 1462-1467.
-
(2006)
Proc IEEE 56th Electronic Components and Technology Conference
, pp. 1462-1467
-
-
Bieler, T.R.1
Jiang, H.2
Lehman, L.P.3
Krikpatrick, T.4
Cotts, E.J.5
|