Impurities in synthetic fluorite for deep ultraviolet optical applications

Journal of Applied Physics

Volumn 106, Issue 6, 2009, Pages

  Sils, J ^a,c   Hausfeld, S ^a   Clauss W ^b   Pahl, U ^b   Lindner, R ^b   Reichling, M ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b CARL ZEISS SMT AG   (Germany)

^c LIMO Lissotschenko Mikrooptik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP ULTRAVIOLET; IMPURITIES IN; IMPURITY CONCENTRATION; IMPURITY CONTENT; LUMINESCENCE SPECTRUM; OPTICAL APPLICATIONS; RARE EARTH IONS; SPECTRAL REGION;

ABSORPTION SPECTROSCOPY; CRYSTAL IMPURITIES; FLUORSPAR; INFRARED SPECTROSCOPY; LUMINESCENCE; OXYGEN; RARE EARTH ELEMENTS;

SINGLE CRYSTALS;

EID: 70349651771     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3224879     Document Type: Article

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