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Volumn 95, Issue 11, 2009, Pages

Transmission electron microscopy investigation of inversion domain boundary in Al0.65 Ga0.35 N grown on AlN/sapphire template

(10) Sang, L W a Fang, H a Qin, Z X a Wang, X Q a Shen, B a Yang, Z J a Zhang, G Y a Zhang, X P a You, L P a Yu, D P a

a PEKING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; COLUMNAR STRUCTURES; HIGH-RESOLUTION TEM ANALYSIS; INVERSION DOMAIN BOUNDARIES; INVERSION DOMAINS; TEM; THREADING DISLOCATION; V-SHAPE;

GALLIUM;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 70349510274 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3231443 Document Type: Article

Times cited : (4)

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