Structural and electrical characterization of boron-containing diamond-like carbon films deposited by femtosecond pulsed laser ablation

Solid State Sciences

Volumn 11, Issue 10, 2009, Pages 1738-1741

  Sikora, A ^a   Berkesse, A ^b   Bourgeois, O ^b   Garden, J L ^b   Guerret Piecourt C ^c   Rouzaud, J N ^d   Loir, A S ^a   Garrelie, F ^a   Donnet, C ^a  

^a UNIVERSITÉ JEAN MONNET   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^c LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

^d ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

Boron doped DLC; Femtosecond; Pulsed laser deposition; Resistivity

Indexed keywords

A-C FILM; BORON-CONTAINING; BORON-DOPED DLC; CLASSICAL MODEL; ELECTRICAL CHARACTERIZATION; ELECTRICAL PROPERTY; FEMTOSECOND; FEMTOSECOND LASER ABLATION; FEMTOSECOND PULSED LASER ABLATION; FIELD EMISSION GUNS; FILM STRUCTURE; HOPPING CONDUCTION; MATRIX; MICRO AND NANODEVICES; NANOMETER SIZE; RESISTIVITY; RESISTIVITY VALUES; ROOM TEMPERATURE; SEM; TEMPERATURE COEFFICIENTS OF RESISTANCE; TEMPERATURE INCREASE; TEMPERATURE RANGE;

ATOMIC FORCE MICROSCOPY; BORON; COATINGS; DIAMOND FILMS; DIAMOND LIKE CARBON FILMS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY; ELECTRIC REACTORS; FIELD EMISSION; GRAPHITE; HARDENING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LASER ABLATION; LASER APPLICATIONS; LASERS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THERMAL CONDUCTIVITY OF SOLIDS;

CARBON FILMS;

EID: 70349337896     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2008.07.013     Document Type: Article

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