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Volumn 11, Issue 37, 2009, Pages 8144-8148
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Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 70349310083
PISSN: 14639076
EISSN: None
Source Type: Journal
DOI: 10.1039/b910903j Document Type: Article |
Times cited : (95)
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References (38)
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