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Volumn 11, Issue 37, 2009, Pages 8144-8148

Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities

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[No Author keywords available]

Indexed keywords


EID: 70349310083     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b910903j     Document Type: Article
Times cited : (95)

References (38)
  • 19
    • 7644237552 scopus 로고    scopus 로고
    • S. Adler Chem. Rev. 2004 104 4791 4844
    • (2004) Chem. Rev. , vol.104 , pp. 4791-4844
    • Adler, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.