Comparison of impedance measurements in a DSP using ellipse-fit and seven-parameter sine-fit algorithms

Measurement: Journal of the International Measurement Confederation

Volumn 42, Issue 9, 2009, Pages 1370-1379

  Ramos, Pedro M ^a,b   Janeiro, Fernando M ^a,c   Radil, Tomáš ^a  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^c UNIVERSITY OF ÉVORA   (Portugal)

Author keywords

Digital signal processor; DSP based instrument; Ellipse fit algorithms; Experimental uncertainty analysis; Impedance measurements; Sine fit algorithms

Indexed keywords

DSP BASED INSTRUMENT; ELLIPSE-FIT ALGORITHMS; EXPERIMENTAL UNCERTAINTY ANALYSIS; IMPEDANCE MEASUREMENTS; SINE-FIT ALGORITHMS;

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; DIGITAL SIGNAL PROCESSORS; ELECTRIC IMPEDANCE MEASUREMENT; GEOMETRY; PARAMETER ESTIMATION; SIGNAL PROCESSING; SPEED CONTROL; STATISTICS;

UNCERTAINTY ANALYSIS;

EID: 70349161059     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2009.05.005     Document Type: Article

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