Impedance measurement with sine-fitting algorithms implemented in a DSP portable device

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 1, 2008, Pages 197-204

  Radil, Tomáš ^a   Ramos, Pedro M ^b,c   Serra, A Cruz ^b,c  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^b INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^c INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Digital signal processor (dsp) based instrumentation; Impedance measurement; Least squares algorithms; Signal acquisition; Sine fitting algorithms

Indexed keywords

DIGITAL-SIGNAL-PROCESSOR (DSP)-BASED INSTRUMENTATION; FITTING ALGORITHMS; IMPEDANCE MEASUREMENT; LEAST SQUARES ALGORITHM; SIGNAL ACQUISITIONS;

ALGORITHMS; DIGITAL SIGNAL PROCESSORS; ELECTRIC IMPEDANCE MEASUREMENT; INSTRUMENTS; MEASUREMENTS; NANOTECHNOLOGY; SIGNAL ANALYSIS; VOLTAGE DIVIDERS;

SIGNAL PROCESSING;

EID: 48749110203     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.908276     Document Type: Article

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