Recent developments on impedance measurements with DSP-based ellipse-fitting algorithms

IEEE Transactions on Instrumentation and Measurement

Volumn 58, Issue 5, 2009, Pages 1680-1689

  Ramos, Pedro M ^a,b   Janeiro, Fernando M ^b,c   Tlemçani, Mouhaydine ^b,c   Cruz Serra, A ^a,b  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^c UNIVERSITY OF ÉVORA   (Portugal)

Author keywords

Digital signal processor (DSP); DSP based instrumentation; Ellipse fitting algorithm; Experimental uncertainty analysis; Impedance measurements

Indexed keywords

ACQUISITION CHANNELS; DATA SEGMENTS; DIGITAL SIGNAL PROCESSING ALGORITHMS; DSP-BASED INSTRUMENTATION; ELLIPSE-FITTING ALGORITHM; ESTIMATED PARAMETERS; EXPERIMENTAL MEASUREMENTS; EXPERIMENTAL UNCERTAINTY ANALYSIS; FREQUENCY SWEEP MEASUREMENTS; IMPEDANCE MEASUREMENTS; MEMORY REQUIREMENTS; NUMBER OF SAMPLES; SIGNAL PARAMETERS;

ALGORITHMS; DATA PROCESSING; DIGITAL SIGNAL PROCESSORS; ELECTRIC IMPEDANCE MEASUREMENT; INSTRUMENTS; MEASUREMENTS; SIGNAL PROCESSING; SPEED CONTROL; SYSTEMATIC ERRORS;

UNCERTAINTY ANALYSIS;

EID: 65549129036     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2014512     Document Type: Conference Paper

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