Method using bilinear transformation for measurement of impedance parameters of a multielement two-terminal network

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 8, 2008, Pages 1670-1677

  Hoja, Jerzy ^a   Lentka, Grzegorz ^a  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Bilinear transformation; Diagnostic instruments; Impedance measurement; Impedance spectroscopy; Parametric identification; Sensitivity analysis

Indexed keywords

CURVE FITTING; HEALTH; LEAST SQUARES APPROXIMATIONS; PORT TERMINALS;

BILINEAR TRANSFORMATIONS; COMPONENT VALUES; FITTING METHODS; IDENTIFICATION METHODS; IMPEDANCE MEASUREMENTS; IMPEDANCE PARAMETERS; IMPEDANCE SPECTRUM; INVERSE BILINEAR TRANSFORMATION; MEASUREMENT FREQUENCY; NON-LINEAR LEAST SQUARES; OBJECT MODELLING; RELATIVE SENSITIVITY; SINGLE-FREQUENCY;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 48749133460     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.922073     Document Type: Article

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