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Volumn 42, Issue 13, 2009, Pages
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The effects of film surface roughness on x-ray diffraction of nonpolar gallium nitride films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
FILM SURFACE MORPHOLOGY;
FILM SURFACES;
GALLIUM NITRIDE FILMS;
IRREGULAR SURFACE;
LATTICE-PLANE BENDING;
LOCAL STRAINS;
NON-POLAR;
NON-POLAR GAN;
PEAK WIDTHS;
SURFACE ROUGHNESS EFFECTS;
WILLIAMSON-HALL PLOT;
X RAY PENETRATION DEPTH;
X-RAY DIFFRACTION DATA;
DIFFRACTION;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
METAL ANALYSIS;
SEMICONDUCTING GALLIUM;
SINGLE CRYSTALS;
SURFACE PROPERTIES;
SURFACE RELAXATION;
SURFACE ROUGHNESS;
X RAY DIFFRACTION;
SURFACE MORPHOLOGY;
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EID: 70349083427
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/42/13/135407 Document Type: Article |
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Times cited : (25)
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References (12)
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