A high-Throughput screening system for thermoelectric material exploration based on a combinatorial film approach

Japanese Journal of Applied Physics

Volumn 48, Issue 5 PART 3, 2009, Pages

  Otani, Makoto ^a   Thomas, Evan L ^a   Wong Ng, Winnie ^a   Schenck, Peter K ^a   Chang, Kao Shuo ^a   Lowhorn, Nathan D ^a   Green, Martin L ^a   Ohguchi, Hiroyuki ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL TOOLS; ELECTRICAL CONDUCTIVITY; FREQUENCY DOMAINS; HIGH-THROUGHPUT; HIGH-THROUGHPUT SCREENING SYSTEMS; MEASUREMENT SYSTEM; POWER FACTORS; SCREENING DEVICES; SPUTTERING DEPOSITION; SRTIO; THERMAL EFFUSIVITY; THERMOELECTRIC MATERIAL; THERMOELECTRIC POWER FACTORS; THERMOREFLECTANCE;

BARIUM; COBALT; ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; PULSED LASER DEPOSITION; SEEBECK COEFFICIENT; THERMAL CONDUCTIVITY; THERMOANALYSIS; THERMODYNAMIC PROPERTIES; THERMOELECTRIC EQUIPMENT; THERMOELECTRIC POWER; TIN;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 70249134228     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/jjAP.48.05EB02     Document Type: Article

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