Distribution analysis of thermal effusivity for sub-micrometer YBCO thin films using thermal microscope

Physica C: Superconductivity and its Applications

Volumn 412-414, Issue SPEC. ISS., 2004, Pages 1337-1342

  Yagi, T ^a   Taketoshi, N ^a   Kato, H ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Superconducting thin films; Thermal effusivity distribution image; Thermoreflectance technique

Indexed keywords

MAGNESIUM COMPOUNDS; MICROMETERS; MICROSCOPES; STATISTICAL METHODS; STRONTIUM COMPOUNDS; SUPERCONDUCTING FILMS; THERMAL VARIABLES MEASUREMENT; THERMODYNAMIC PROPERTIES;

THERMAL EFFUSIVITRY DISTRIBUTION RANGE; THERMAL EFFUSIVITY; THERMAL MICROSCOPES; THERMOREFLECTANCE TECHNIQUES;

YTTRIUM COMPOUNDS;

EID: 4644372456     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2003.12.087     Document Type: Conference Paper

References (3)

1. N. Taketoshi, M. Ozawa, H. Ozawa, T. Baba, in: Proceedings of 10th International Conference of Photoacoustic and Photothermal Phenomena, 1999, p. 315.
2. H. Kato, N. Nara, M. Okaji, A. Rykov, S. Tajima, N. Koshizuka, in: Advances in Superconductivity X, Proceedings of ISS'97, 1997, p. 139.
3. Hagen S.J., Wang Z.Z., Ong N.P. Phys. Rev. B. 40:1989;9389.