Silica nanoparticles at interfaces modulated by amphiphilic polymer and surfactant

Langmuir

Volumn 24, Issue 14, 2008, Pages 7346-7353

  De Rezende, Camila Alves ^a,b   Lee, Lay Theng ^a   Galembeck, Fernando ^b  

^a CEA SACLAY   (France)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ACRYLIC MONOMERS; ADSORPTION; AMIDES; ANIONIC SURFACTANTS; DEWATERING; DIFFUSERS (OPTICAL); FLOW INTERACTIONS; HYDROPHILICITY; HYDROPHOBICITY; NANOPARTICLES; NANOSTRUCTURES; POLYMER SOLUTIONS; POLYMERS; SILICA; SILICATE MINERALS; SILICON COMPOUNDS; SODIUM; SODIUM SULFATE; SOLID SOLUTIONS; SUBSTRATES; SULFATE MINERALS; SURFACE ACTIVE AGENTS; SURFACE CHEMISTRY;

AMERICAN CHEMICAL SOCIETY (ACS); AMPHIPHILIC POLYMERS; AMPHIPHILIC(AP); CHAIN STRUCTURES; CHARGED POLYMERS; DE-WETTING; HYDROPHILIC AND HYDROPHOBIC; HYDROPHILIC SUBSTRATES; HYDROPHILIC SURFACES; HYDROPHOBIC SUBSTRATES; HYDROPHOBIC SURFACES; INTERFACIAL BEHAVIORS; INTERFACIAL PROPERTIES; NANO PARTICLES; NANOPARTICLE ASSEMBLIES; NEUTRON REFLECTIVITY (NR); PARTICLE SUBSTRATE INTERACTIONS; POLY(N-ISOPROPYLACRYL-AMIDE) (PNIPAM); PURE WATER; SILICA NANO-PARTICLES; SODIUM DODECYL SULFATE (SDS); SOLID SUBSTRATE (SS); TEMPLATED; WEAK INTERACTIONS;

NANOSTRUCTURED MATERIALS;

ACRYLIC ACID RESIN; NANOPARTICLE; POLY N ISOPROPYLACRYLAMIDE; POLY-N-ISOPROPYLACRYLAMIDE; SILICON DIOXIDE; SURFACTANT; WATER;

ADSORPTION; ARTICLE; CHEMISTRY; GAS; HYDROPHOBICITY; OXIDATION REDUCTION REACTION; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

ACRYLIC RESINS; ADSORPTION; GASES; HYDROPHOBICITY; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION; NANOPARTICLES; OXIDATION-REDUCTION; PARTICLE SIZE; SILICON DIOXIDE; SURFACE PROPERTIES; SURFACE-ACTIVE AGENTS; WATER;

EID: 47949113138     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la8004807     Document Type: Article

References (47)

1. Hermanson, K. D.; Lumsdon, S. O.; Williams, J. P.; Kaler, E. W.; Velev, O. D. Science 2001, 294, 1082.
2. An, L. J.; Li, W.; Nie, Y. R.; Xie, B.; Li, Z. Q.; Zhang, J. H.; Yang, B. J. Colloid Interface Sci. 2005, 288, 503.
3. Xu, X. L.; Friedman, G.; Humfeld, K. D.; Majetich, S. A.; Asher, S. A. Adv. Mater. 2001, 13, 1681.
4. Wakabayashi, A.; Sasakawa, Y.; Dobashi, T.; Yamamoto, T. Langmuir 2006, 22, 9260.
5. Doyle, P. S.; Bibette, J.; Bancaud, A.; Viovy, J. L. Science 2002, 295, 2237.
6. Huwiler, C.; Halter, M.; Rezwan, K.; Falconnet, D.; Textor, M.; Voros, J. Nanotechnology 2005, 16, 3045.
7. Haken, H. Information and self-organization: a macroscopic approach to complex systems; Springer-Verlag: Berlin, 2000; 222p
8. Kumar, A.; Whitesides, G. M. Appl. Phys. Lett. 1993, 63, 2002.
9. Aizenberg, J.; Braun, P. V.; Wiltzius, P. Phys. Rev. Lett. 2000, 84, 2997.
10. Burghard, M.; Philipp, G.; Roth, S.; Von Klitzing, K. Appl Phys. A 1998, 67, 591.
11. Cheng, J. Y.; Ross, C. A.; Thomas, E. L.; Smith, H. I.; Vancso, G. J. Adv. Mater. 2003, 15, 1599.
12. Zehner, R. W.; Sita, L. R. Langmuir 1999, 15, 6139.
13. Hamley, I. W. Nanotechnology 2003, 14, 39.
14. Park, C.; Yoon, J.; Thomas, E. L. Polymer 2003, 44, 6725.
15. Jiang, K. Y.; Eitan, A.; Schadler, L. S.; Ajayan, P. M.; Siegel, R. W.; Grobert, N.; Mayne, M.; Reyes-Reyes, M.; Terrones, H.; Terrones, M. Nano Lett. 2003, 3, 275.
16. Fullam, S.; Cottell, D.; Rensmo, H.; Fitzmaurice, D. Adv. Mater. 2000, 12, 1430.
17. Nakao, H.; Shiigi, H.; Yamamoto, Y.; Tokonami, S.; Nagaoka, T.; Sugiyama, S.; Ohtani, T. Nano Lett. 2003, 3, 1391.
18. Behrens, S.; Habicht, W.; Wagner, K.; Unger, E. Adv. Mater. 2006, 18, 284.
19. He, Y. H.; Yuan, J. Y.; Su, F. Y.; Xing, X. H.; Shi, G. Q. J. Phys. Chem. B 2006, 110, 17813.
20. Dujardin, E.; Peet, C.; Stubbs, G.; Culver, J. N.; Mann, S. Nano Lett. 2003, 3, 413.
21. Sehgal, A.; Ferreiro, V.; Douglas, J. F.; Amis, E. J.; Karim, A. Langmuir 2002, 18, 7041.
22. Zhang, Z. X.; Wang, Z.; Xing, R. B.; Han, Y. C. Surf. Sci. 2003, 539, 129.
23. Yoon, B. K.; Huh, J.; Kim, H. C.; Hong, J. M.; Park, C. Macromolecules 2006, 39, 901.
24. Zhang, F. J.; Baralia, G.; Boborodea, A.; Bailly, C.; Nysten, B.; Jonas, A. M. Langmuir 2005, 21, 7427.
25. Yi, K. C.; Hórvölgyi, Z.; Fendler, J. H. J. Phys. Chem. 1994, 98, 3872.
26. Luo, C.; Xing, R.; Han, Y. Surf. Sci. 2004, 552, 139.
27. Kralchevsky, P. A.; Nagayama, K. In Particles at Fluid Interfaces and Membranes; Elsevier: Amsterdam 2001, p 503.
28. Nagayama, K. Colloids Surf., A 1996, 109, 363.
29. Kralchevsky, P. A. Adv. Biophys. 1997, 34, 25.
30. Yeh, S. R.; Seul, M.; Shraiman, B. I. Nature 1997, 386, 57.
31. Dockendorf, C. P. R.; Choi, T. Y.; Poulikakos, D.; Stemmer, A. Appl Phys. Lett. 2006, 88, 131903.
32. Reuter, T.; Vidoni, O.; Torma, V.; Schmid, G.; Nan, L.; Gleiche, M.; Chi, L.; Fuchs, H. Nano Lett. 2002, 2, 709.
33. Chung, S. W.; Markovich, G.; Heath. J. R. J. Phys. Chem. B 1998, 102, 6685.
34. Braun, E.; Eichen, Y.; Sivan, U.; Ben-Yoseph, G. Nature 1998, 391, 775.
35. Scheibel, T.; Parthasarathy, R.; Sawicki, G.; Lin, X. L.; Jaeger, H.; Linquist, S. L. PNAS 2003, 10, 4527.
36. Lee, L. T.; Silva, M. C. V.; Galembeck, F. Langmuir 2003, 19, 6717.
37. Lee, L. T.; Leite, C. A. P.; Galembeck, F. Langmuir 2004, 20, 4430.
38. Rezende, C. A.; Lee, L. T.; Galembeck, F. Langmuir 2007, 23, 2824.
39. Cousin, F. Private communication.
40. Egerton, R. F. Electron energy-loss spectroscopy in the electron microscope; Plenum Press: New York, 1989.
41. Lee, L. T.; Jean, B.; Menelle, A. Langmuir 1999, 15, 3267.
42. Petit, L.; Bouteiller, L.; Brulet, A.; Lafuma, F.; Hourdet, D. Langmuir 2007, 23, 147.
43. Costa, C. A. R.; Leite, C. A. P.; Lee, L. T.; Galembeck, F. Prog. Colloid Polym. Sci. 2004, 128, 74.
44. Costa, C. A. R.; Leite, C. A. P.; Galembeck, F. J. Phys. Chem. B 2003, 107, 4747.
45. Jean, B.; Lee, L. T.; Cabane. B. Langmuir 1999, 15, 7585.
46. Lee, L. T.; Cabane, B. Macromolecules 1997, 30, 6559.
47. Denkov,N. D.; Velev, O. D.; Kralchevsky, P. A.;Ivanov, I. B.; Yoshimura, H.; Nagayama, K. Langmuir 1992, 8, 3183.