Nanoscale measurements for computing Young's modulus with atomic force microscope

Current Science

Volumn 76, Issue 12, 1999, Pages 1561-1566

  Kaul, A D ^a   Gangwal, A ^b   Wadhwa, S S ^a  

^a CSIR CENTRAL SCIENTIFIC INSTRUMENTS ORGANISATION   (India)

^b BIRLA INSTITUTE OF TECHNOLOGY AND SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009523481     PISSN: 00113891     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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