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Volumn 484, Issue 1-2, 2009, Pages 341-346
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Synthesis and characterization of 3C and 2H-SiC nanocrystals starting from SiO2, C2H5OH and metallic Mg
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Author keywords
Nanostructured materials; Silicon carbide; Transmission electron microscopy; X ray diffraction
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Indexed keywords
CUBIC PHASE;
EMISSION PEAKS;
ROOM-TEMPERATURE PHOTOLUMINESCENCE;
SIC NANOWIRE;
SYNTHESIS AND CHARACTERIZATION;
THERMAL GRAVIMETRIC ANALYSIS;
THERMAL STABILITY;
TRANSMISSION ELECTRON MICROSCOPY IMAGES;
DIFFRACTION;
ELECTRIC WIRE;
ELECTRON MICROSCOPY;
ELECTRONS;
EMISSION SPECTROSCOPY;
GRAVIMETRIC ANALYSIS;
HOLOGRAPHIC INTERFEROMETRY;
NANOCRYSTALS;
NANOSTRUCTURED MATERIALS;
NANOWIRES;
SILICON CARBIDE;
SILICON OXIDES;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 69949098168
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2009.04.096 Document Type: Article |
Times cited : (29)
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References (35)
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