Stacking faults in β-SiC formed during carbothermal reduction of SiO2

Journal of the American Ceramic Society

Volumn 79, Issue 7, 1996, Pages 1777-1782

  Seo, Won Seon ^a   Koumoto, Kunihito ^a,b  

^a NAGOYA UNIVERSITY   (Japan)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON BLACK; CRYSTAL WHISKERS; FABRICATION; MICROSCOPIC EXAMINATION; MORPHOLOGY; PARTICLE SIZE ANALYSIS; REDUCTION; SILICA; STACKING FAULTS; SYNTHESIS (CHEMICAL); VAPOR PRESSURE; X RAY DIFFRACTION;

CARBOTHERMAL REDUCTION; STACKING FAULT DENSITY;

SILICON CARBIDE;

EID: 0030190571     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb07995.x     Document Type: Article

References (19)

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