Structures, varistor properties, and electrical stability of ZnO thin films

Materials Letters

Volumn 63, Issue 27, 2009, Pages 2321-2323

  Lu, Hui ^a   Wang, Yuele ^a   Lin, Xian ^a  

^a EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Electrical properties; Microstructure; Stability; Varistors; ZnO thin film

Indexed keywords

DC BIAS; DEGRADATION RATE; ELECTRICAL PROPERTIES; ELECTRICAL STABILITY; GAS DISCHARGE; IV CHARACTERISTICS; LAYERED SAMPLE; NONLINEAR COEFFICIENT; POLYCRYSTALLINE STRUCTURE; PREFERRED ORIENTATIONS; VARISTOR VOLTAGE; ZNO; ZNO THIN FILM;

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; DEGRADATION; DEPOSITION; GLOW DISCHARGES; METALLIC FILMS; MICROSTRUCTURE; OPTICAL FILMS; PHOTODEGRADATION; SEMICONDUCTING ZINC COMPOUNDS; STABILITY; THIN FILM DEVICES; THIN FILMS; VAPOR DEPOSITION; VARISTORS; X RAY DIFFRACTION; ZINC OXIDE;

ELECTRIC PROPERTIES;

EID: 69849103015     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2009.08.001     Document Type: Article

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