Enhancing the yield competitiveness of a semiconductor fabrication factory with dynamic capacity re-allocation

Computers and Industrial Engineering

Volumn 57, Issue 3, 2009, Pages 931-936

  Chen, Toly ^a  

^a FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Capacity; Competitiveness; Re allocation; Semiconductor; Yield learning

Indexed keywords

CAPACITY; COMPETITIVENESS; RE-ALLOCATION; SEMICONDUCTOR; YIELD LEARNING;

FABRICATION;

COMPETITION;

EID: 69649083470     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2009.03.007     Document Type: Article

References (14)

1. Armstrong, E. (1989). Principles for competitive semiconductor manufacturing. In Proceedings of IEEE SEMI international semiconductor manufacturing science symposium'89 (pp. 67-72).
2. Chen, T. (2007). A fuzzy logic approach for incorporating the effects of managerial actions on semiconductor yield learning. In Proceedings of ICMLC 2007 (pp. 1979-1984).
3. Chen T. Evaluating the mid-term competitiveness of a product in a semiconductor fabrication factory with a systematic procedure. Computers & Industrial Engineering 53 (2007) 499-513
4. Chen T., and Wang M.-J.J. A fuzzy set approach for yield learning modeling in wafer manufacturing. IEEE Transactions on Semiconductor Manufacturing 12 2 (1999) 252-258
5. Crowder, B. C. (1989) Manufacturing science and manufacturing competitiveness. In Proceedings of IEEE SEMI international semiconductor manufacturing science symposium'89 (pp. 32-33).
6. Cunningham J.A. The use and evaluation of yield models in integrated circuit manufacturing. IEEE Transactions on Semiconductor Manufacturing 3 2 (1990) 60-71
7. Gruber H. Learning and strategic product innovation: Theory and evidence for the semiconductor industry (1994), Elsevier Science Publishers, BV, The Netherlands
8. Haller M., Peikert A., and Thoma J. Cycle time management during production ramp-up. Robotics and Computer Integrated Manufacturing 19 (2003) 183-188
9. Li T.-S., Huang C.-L., and Wu Z.-Y. Data mining using genetic programming for construction of a semiconductor manufacturing yield rate prediction system. International Journal of Advanced Manufacturing Technology 17 (2006) 355-361
10. Majd S., and Pindyck R.S. The learning curve and optimal production under uncertainty. Rand Journal of Economics 20 3 (1989) 331-343
11. Mazzola J.B., and McCardle K.F. A Bayesian approach to managing learning-curve uncertainty. Management Science 42 5 (1995) 680-692
12. Shimada Y., and Sakurai K. A new accurate yield prediction method for system-LSI embedded memories. IEEE Transactions on Semiconductor Manufacturing 16 3 (2003) 436-445
13. Spence A.M. The learning curve and competition. Bell Journal of Economics 12 (1981) 49-70
14. Watada J., Tanaka H., and Shimomura T. Identification of learning curve based on possibilistic concepts. Applications of Fuzzy Set Theory in Human Factors (1986), Elsevier Science Publishers, BV, The Netherlands