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Volumn , Issue , 2008, Pages
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Local dependency analysis in probabilistic scene estimation
a
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
APPLICATION REQUIREMENTS;
DEPENDENCY ANALYSIS;
GENERAL SOLUTIONS;
HIGH QUALITY;
HIGH-PRECISION LOCALIZATION;
MECHATRONICS;
ESTIMATION;
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EID: 69549118553
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISMA.2008.4648815 Document Type: Conference Paper |
Times cited : (5)
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References (13)
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