Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level

Microelectronics Reliability

Volumn 49, Issue 9-11, 2009, Pages 1153-1157

  Jeong, Jae Seong ^a   Park, Sang Deuk ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED ANALYSIS; COMPOSITE VIDEO; ELECTRONIC DEVICE; FAULT ISOLATION; FIELD FAILURE; HIGHLY ACCELERATED LIFE TESTING; NO FAULT FOUND; SEM; STRESS FACTORS; STRESS PROFILE; SYSTEM LEVELS; VIDEO PROCESSOR;

DEFECTS; FLAT PANEL DISPLAYS; QUALITY ASSURANCE; SAFETY FACTOR; STATISTICAL PROCESS CONTROL; STRESS ANALYSIS; TESTING;

FAILURE ANALYSIS;

EID: 69249217717     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2009.07.049     Document Type: Article

References (9)

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