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Volumn 95, Issue 6, 2009, Pages
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Effect of threshold voltage instability on field effect mobility in thin film transistors deduced from constant current measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
CONSTANT CURRENT;
CONVENTIONAL METHODS;
EMERGING MATERIALS;
FIELD EFFECTS;
FIELD-EFFECT MOBILITIES;
MEASURING DEVICE;
STATIC CHARACTERISTIC;
STATIC MEASUREMENTS;
THRESHOLD VOLTAGE SHIFTS;
TRANSIENT PHENOMENON;
ELECTRIC CURRENT MEASUREMENT;
FINITE ELEMENT METHOD;
THIN FILM TRANSISTORS;
THIN FILMS;
THRESHOLD VOLTAGE;
FIELD EFFECT TRANSISTORS;
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EID: 69049120329
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3195641 Document Type: Article |
Times cited : (3)
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References (11)
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