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Volumn 38, Issue 9, 2009, Pages 1931-1937

How r-plane Al 2O 3 surface modifications impact the growth of epitaxial (001) CeO 2 thin films

a Michigan Technological University (United States)

Author keywords

Atomic force microscopy; Heteroepitaxy; High resolution x ray diffraction; RF magnetron sputtering; Surface modification

Indexed keywords

ATOMIC TERRACES; CRYSTALLOGRAPHIC ORIENTATIONS; HETEROEPITAXY; HIGH-RESOLUTION X-RAY DIFFRACTION; IN-PLANE ORIENTATION; MULTI DOMAINS; POLYCRYSTALLINE; RF MAGNETRON SPUTTERING; SINGLE-CRYSTAL; SURFACE MODIFICATION; TWO DOMAINS;

ALUMINUM; ATOMIC FORCE MICROSCOPY; ATOMS; DIFFRACTION; LANDFORMS; MAGNETRON SPUTTERING; MAGNETRONS; SINGLE CRYSTALS; SOIL CONSERVATION; SURFACE TREATMENT; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL GROWTH;

EID: 68949162060 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-009-0864-6 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.