Fundamental thickness limit of itinerant ferromagnetic SrRuO3 thin films

Physical Review Letters

Volumn 103, Issue 5, 2009, Pages

  Chang, Young Jun ^a   Kim, Choong H ^a   Phark, S H ^a   Kim, Y S ^a   Yu, J ^a   Noh, T W ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY OF STATE; FERROMAGNETIC OXIDES; ORBITALS; QUANTUM CONFINEMENT EFFECTS; STONER MODEL; THIN-FILM GEOMETRY; UNIT CELLS;

FERROMAGNETIC MATERIALS; FERROMAGNETISM; THIN FILMS;

QUANTUM CONFINEMENT;

EID: 68749107214     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.103.057201     Document Type: Article

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