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Volumn 48, Issue 6, 2009, Pages
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Design of a near-perfect anti reflective layer for Si photodetectors based on a SiO2 film embedded with Si nanocrystals
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTI-REFLECTION COATINGS;
ANTI-REFLECTIVE LAYERS;
LIGHT LOSS;
SI NANOCRYSTAL;
SINGLE LAYER;
THICKNESS OF THE FILM;
LIGHT REFLECTION;
NANOCRYSTALS;
OPTOELECTRONIC DEVICES;
PHOTODETECTORS;
SILICON COMPOUNDS;
SILICON;
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EID: 68649114389
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.48.060206 Document Type: Article |
Times cited : (4)
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References (12)
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