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Volumn 48, Issue 6, 2009, Pages

Design of a near-perfect anti reflective layer for Si photodetectors based on a SiO2 film embedded with Si nanocrystals

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-REFLECTION COATINGS; ANTI-REFLECTIVE LAYERS; LIGHT LOSS; SI NANOCRYSTAL; SINGLE LAYER; THICKNESS OF THE FILM;

EID: 68649114389     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.060206     Document Type: Article
Times cited : (4)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.