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Volumn 23, Issue 17, 2009, Pages 3625-3630

Optimization of phase change memory with thin metal inserted layer on material properties

Author keywords

Electrical resistivity; Finite element modeling; Low reset current; Phase change memory (PCM); Phase change memory with thin metal interlayer (PCMTMI); Thermal conductivity

Indexed keywords


EID: 68449085343     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217979209063080     Document Type: Conference Paper
Times cited : (3)

References (13)
  • 4
    • 68449094049 scopus 로고    scopus 로고
    • 7362004
    • 736(2004).
  • 9
    • 0141745746 scopus 로고    scopus 로고
    • D.H. Kang, D.H. Ahn, K.B. Kim, J.F. Webb and K.W.Yi: J. Appl. Phys. 94, 3536(2003). Y.H. Ha et. al.: Symp. VLSI Technology Dig. Tech. Pap., 175(2003).
    • D.H. Kang, D.H. Ahn, K.B. Kim, J.F. Webb and K.W.Yi: J. Appl. Phys. 94, 3536(2003). Y.H. Ha et. al.: Symp. VLSI Technology Dig. Tech. Pap., 175(2003).
  • 13
    • 68449087837 scopus 로고    scopus 로고
    • J.H. Yi et. al.: EDM Tech. Dig., 37.3.1(2003).
    • J.H. Yi et. al.: EDM Tech. Dig., 37.3.1(2003).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.