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Volumn 23, Issue 17, 2009, Pages 3625-3630
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Optimization of phase change memory with thin metal inserted layer on material properties
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Author keywords
Electrical resistivity; Finite element modeling; Low reset current; Phase change memory (PCM); Phase change memory with thin metal interlayer (PCMTMI); Thermal conductivity
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Indexed keywords
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EID: 68449085343
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/S0217979209063080 Document Type: Conference Paper |
Times cited : (3)
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References (13)
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