Spectroscopic ellipsometry applied to phase transitions in solids: Possibilities and limitations

Optics Express

Volumn 17, Issue 16, 2009, Pages 14322-14338

  Dejneka, Alexandr ^a   Aulika, Ilze ^b   Trepakov, Vladimir ^a   Krepelka, Jaromir ^c   Jastrabik, Lubomir ^a   Hubicka, Zdenek ^a   Lynnyk, Anna ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b UNIVERSITY OF LATVIA   (Latvia)

^c Joint Laboratory of UPOL and FZU AS CR   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; ENERGY GAP; OXIDE FILMS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS;

BAND GAP ENERGY; ELLIPSOMETRIC ANGLES; ELLIPSOMETRIC DATA; OXIDE THIN FILMS;

SURFACE DEFECTS;

ALGORITHM; ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; METHODOLOGY; PHASE TRANSITION; POWDER; REFRACTOMETRY; SPECTROSCOPY;

ALGORITHMS; COMPUTER SIMULATION; MODELS, CHEMICAL; PHASE TRANSITION; POWDERS; REFRACTOMETRY; SPECTRUM ANALYSIS;

EID: 68349127178     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.014322     Document Type: Article

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