Review of recent advances in spectrum imaging and its extension to reciprocal space

Journal of Electron Microscopy

Volumn 58, Issue 3, 2009, Pages 99-109

  Maigné, Alan ^a   Twesten, Ray D ^a  

^a GATAN INC   (United States)

Author keywords

Atomic resolution analysis; Diffraction imaging; EELS; ELNES; Multivariate analysis; Spectrum Imaging

Indexed keywords

COMPUTER AIDED ANALYSIS; DIFFRACTION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LEAST SQUARES APPROXIMATIONS; MULTIVARIANT ANALYSIS; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS;

ATOMIC RESOLUTION ANALYSE; ATOMIC-RESOLUTION; DIFFRACTION IMAGING; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELNES; MULTI VARIATE ANALYSIS; RECIPROCAL SPACE; RESOLUTION ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTRUM IMAGING;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 68349120232     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfp022     Document Type: Article

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