New trends in STEM-based nano-EELS analysis

Journal of Electron Microscopy

Volumn 45, Issue 1, 1996, Pages 44-50

  Colliex, Christian ^a  

^a CNRS   (France)

Author keywords

Data analysis; Electron energy loss spectroscopy; Nanoanalysis; Nanostructures

Indexed keywords

CHEMICAL BONDS; DATA ACQUISITION; DATA HANDLING; DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISSIPATION; IMAGE ENHANCEMENT; SPECTRUM ANALYSIS;

ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELECTRONIC BONDING; ELECTRONIC CHEMICALS; ELECTRONIC INFORMATION; FINE STRUCTURES; IMAGE MODES; NANOANALYSE; SPECTRUM IMAGES; STRUCTURAL INFORMATION; SUB NANOMETERS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 0002088267     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023411     Document Type: Article

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