Sapphire sample carriers for silicon determination by total-reflection X-ray fluorescence analysis

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 54, Issue 13, 1999, Pages 1839-1848

  Theisen, M ^a   Niessner, R ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Airborne particulate matter; Sapphire sample carriers; Silicon determination; TXRF

Indexed keywords

EID: 0347031179     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(99)00125-1     Document Type: Article

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