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Applied Physics Letters

Volumn 95, Issue 3, 2009, Pages

Atomic-scale spectroscopic imaging of CoFeB/Mg-B-O/CoFeB magnetic tunnel junctions

(8) Cha, J J a Read, J C a,b Egelhoff, W F b Huang, P Y a Tseng, H W a Li, Y a Buhrman, R A a Muller, D A a

a Cornell University (United States)

b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; B DIFFUSION; ELECTRON SPECTROSCOPIC IMAGING; INTERFACIAL LAYER; MAGNETIC TUNNEL JUNCTION; RADIO FREQUENCY SPUTTERING; ROOM TEMPERATURE; SPECTROSCOPIC IMAGING; TUNNEL BARRIER; TUNNELING MAGNETORESISTANCE;

ATOMIC SPECTROSCOPY; ATOMS; COBALT COMPOUNDS; DIFFUSION IN SOLIDS; ELECTRIC RESISTANCE; MAGNETIC DEVICES; MAGNETIC FIELD EFFECTS; MAGNETORESISTANCE; SEMICONDUCTOR JUNCTIONS; SPIN POLARIZATION; WAVEGUIDE JUNCTIONS; WIND TUNNELS;

TUNNEL JUNCTIONS;

EID: 67651244221 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3184766 Document Type: Article

Times cited : (44)

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