Evolution of dislocations in perylene films with thickness and deposition rate

Physica Status Solidi - Rapid Research Letters

Volumn 2, Issue 1, 2008, Pages 1-3

  Beigmohamadi, M ^a   Niyamakom, P ^a   Farahzadi, A ^a   Kremers, S ^a   Michely, T ^a,b   Wuttig, M ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (SPECIFIC GRAVITY); DISLOCATIONS (CRYSTALS); FILM THICKNESS; GRAIN GROWTH; STRAIN; X RAY DIFFRACTION ANALYSIS;

DISLOCATION DENSITY; MICROSTRAIN; PERYLENE FILMS;

FILM GROWTH;

EID: 38549094743     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200701221     Document Type: Article

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