Standardization of nanomaterials characterization by scanning probe microscopy for societal acceptance

Journal of Physics: Conference Series

Volumn 159, Issue , 2009, Pages

  Fujita, Daisuke ^a   Onishi, Keiko ^a   Xu, Mingsheng ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650689890     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/159/1/012002     Document Type: Article

References (17)

1. Nel A, Xia T, Madler L and Li N 2006 Science 311 622
2. Colvin V L 2003 Nature Biotechnology 21 1166
3. Jia G, Wang H, Yan L, Wang X, Pei R, Yan T, Zhao Y and Guo X 2005 Environ. Sci. Technol. 39 1378
4. Isobe H, Tanaka T, Maeda R, Noiri E, Solin N, Yudasaka M, Iijima S and Nakamura E 2006 Angew. Chem. Int. Ed. 45 6676
5. Todua P A 2008 Meas. Techniques 51 462
6. Rashba E and Gamota D 2003 J. Nanopart. Res. 5 401
7. Binnig G and Rohrer H 1982 Helv. Phys. Acta. 55 726
8. Binnig G, Quate C F and Gerber Ch 1986 Phys. Rev. Lett. 56 930
9. Fujita D and Sagisaka K 2008 Sci. Technol. Adv. Mater. 9 013003
10. Fujita D, Itoh H, Ichimura S and Kurosawa T 2007 Nanotechnology 18 084002
11. Onishi K and Fujita D 2008 J. Vac. Soc.Japan. 51 165
12. Xu M, Fujita D, Onishi K and Miyazawa K 2009 J. Nanosci. Nanotechnol. 9 in press
13. Xu M, Pathak Y, Fujita D, Ringor C and Miyazawa K 2008 Nanotechnology 19 075712
14. http://www.vamas.org/
15. ISO 14976 2000 Surface chemical analysis - Data Transfer Format
16. Keller D 1991 Surf. Sci. 253 353
17. Itoh H, Fujimoto T and Ichimura S 2006 Rev. Sci. Instrum. 11 103704