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Volumn 51, Issue 3, 2008, Pages 165-168
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Novel image restoration method using spherical nano-particles for atomic force microscopy topography data containing tip-induced distortions
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
ATOMIC FORCE MICROSCOPY;
IMAGE RECONSTRUCTION;
NANOPARTICLES;
NANOSPHERES;
PARTICLE SIZE;
RESTORATION;
SILICON WAFERS;
SPHERES;
TOPOGRAPHY;
EXPERIMENTAL DEMONSTRATIONS;
FLAT SUBSTRATES;
NUMERICAL CALCULATION;
PARTICLE SIZE STANDARDS;
RESTORATION METHODS;
SURFACE MICROSTRUCTURES;
TOPOGRAPHY IMAGES;
TOPOGRAPHY IMAGING;
SURFACE TOPOGRAPHY;
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EID: 46749098007
PISSN: 18822398
EISSN: None
Source Type: Journal
DOI: 10.3131/jvsj2.51.165 Document Type: Article |
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Times cited : (5)
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References (6)
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