Diagnostic nano-analysis of materials properties by multivariate curve resolution applied to spectrum images by S/TEM-EELS

Materials Transactions

Volumn 50, Issue 5, 2009, Pages 964-969

  Muto, Shunsuke ^a   Yoshida, Tomoko ^a   Tatsumi, Kazuyoshi ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Electron energy loss spectroscopy; Multivariate curve resolution; Spectrum image; Transmission electron microscopy

Indexed keywords

APPLICATION EXAMPLES; CHEMICAL STATE; DATA ARRAY; DATA CUBE; DATA SETS; EELS SPECTRA; ENERGY FILTERING; MULTIVARIATE CURVE RESOLUTION; REFERENCE SPECTRUM; SCANNING TEM; SPATIAL DISTRIBUTION MAP; SPECTRAL COMPONENTS; SPECTRUM IMAGE; SPECTRUM IMAGES; SPECTRUM IMAGING; TEM;

AUGER ELECTRON SPECTROSCOPY; DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPES; ELECTRON SCATTERING; ELECTRONS; MATERIALS PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; TWO DIMENSIONAL;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 67650490314     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.MC200805     Document Type: Conference Paper

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