An electron energy-loss spectrometry study of charge compensation in LiNi0.8Co0.2O2

Journal of Physical Chemistry B

Volumn 107, Issue 13, 2003, Pages 2887-2891

  Graetz, J ^a   Ahn, C C ^a   Yazami, R ^a   Fultz, B ^a  

^a California Institute of Technology ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COMPENSATION; DELITHIATION; ELECTRON ENERGY LOSS SPECTROMETRY; LITHIUM NICKEL COBALT ALLOYS;

ELECTRIC CHARGE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSITIONS; ELECTRONIC STRUCTURE; MAGNETIC VARIABLES MEASUREMENT; NUMERICAL METHODS;

LITHIUM COMPOUNDS;

EID: 0038403742     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp026484y     Document Type: Article

References (32)

1. Saadoune, I.; Delmas, C. J. Solid State Chem. 1998, 136, 8.
2. Delmas, C.; Saadoune, I. Solid State Ionics 1992, 370-375, 53-56.
3. Balasubramanian, M.; Sun, X.; Yang, X. Q.; McBreen, J. J. Electrochem. Soc. 2000, 147, 2903.
4. Mansour, A. N.; McBreen, J.; Melendres, C. A. J. Electrochem. Soc. 1999, 146, 2799.
5. Mansour, A. N.; Croguennec, L.; Prado, G.; Delmas, C. J. Synchrotron Rad. 2001, 8, 866.
6. Mansour, A. N.; Yang, X. Q.; Sun, X.; McBreen, J.; Croguennec, L.; Delmas, C. J. Electrochem. Soc. 2000, 147, 2104.
7. Nakai, I.; Takahashi, K.; Shiraishi, Y.; Nakagome, T. J. Phys. IV France 1997, 7 (C2), 1243.
8. Nakai, I.; Takahashi, K.; Shiraishi, Y.; Nakagome, T. J.; Izumi, F.; Ishii, Y. Nishikawa, F.; Konishi, T. J. Power Sources 1997, 68, 536.
9. Nakai, I.; Nakagome, T. J. Electrochem. Solid-State Lett. 1998, 1, 259.
10. Nonaka, T.; Okuda, C.; Ukyo, Y.; Okamoto, T. J. Synchrotron Rad. 2001, 8, 869.
11. Montoro, L. A.; Abbate, M.; Rosolen, J. M. J. Electrochem. Soc. 2000, 147, 1651.
12. Montoro, L. A.; Abbate, M.; Rosolen, J. M. Electrochem. Solid-State Lett. 2000, 3, 410.
13. Uchimoto, Y.; Sawada, H.; Yao, T. J. Power Sources 2001, 97/98, 326.
14. Graetz, J.; Hightower, A.; Ahn, C. C.; Yazami, R.; Rez, P.; Fultz, B. J. Phys. Chem. B 2002, 106, 1286.
15. Yoon, W. S.; Kim, K. B.; Kim, M. G.; Lee, M. K.; shin, H. J.; Lee, J. M.; Lee, J. S.; Yo, C. H. J. Phys. Chem. B 2002, 106, 2526.
16. Wolverton, C.; Zunger, A. Phys. Rev. Lett. 1998, 81, 606.
17. Aydinol, M. K.; Kohan, A. F.; Ceder, G.; Cho K.; Joannopoulos, J. J. Phys. Rev. B 1997, 56, 1354.
18. Ceder, G.; Aydinol, M. K.; Kohan, A. F. Comput. Mater. Sci. 1997, 8, 161.
19. Van der Ven, A.; Aydinol, M. K.; Ceder, G.; Kresse, G.; Hafner, J. J. Phys. Rev. B 1998, 58, 2975.
20. Ronci, F.; Scrosati, B.; Rossi Albertini, V.; Perfetti, P. J. Phys. Chem. B 2001, 105, 754.
21. Egerton, R. F. Electron Energy Loss Spectrometry in the Electron Microscope; Plenum: New York, 1986.
22. Vvedensky, D. D.; Pendy, J. B. Phys. Rev. Lett. 1985, 54, 2725.
23. Rez, P.; Weng, X.; Ma, H. Microsc. Microanal. Microstruct. 1991, 2, 143.
24. Kurata, H.; Lefevre, E.; Coliex, C.; Brydson, R. Phys. Rev. B 1993, 47, 13763.
25. Stolojan, V.; Walsh, C. A.; Yuan, J.; Brown, L. M. Inst. Phys. Conf. Ser. 1999, 161, 235.
26. Pearson, D. H.; Fultz, B.; Ahn, C. C. Appl. Phys. Lett. 1988, 53, 1405.
27. Pearson, D. H.; Ahn, C. C.; Fultz, B. Phys. Rev. B 1992, 47, 8471.
28. Leapman, R. D.; Grunes, L. A.; Fejes, P. L. Phys. Rev. B 1981, 26, 614.
29. Sparrow, T. G.; Williams, B. G.; Rao, C. N. R.; Thomas, J. M. Chem. Phys. Lett. 1984, 108, 547.
30. Kuiper, P.; Kruizinga, G.; Ghijsen, J.; Sawatzky, G. A. Phys. Rev. Lett. 1989, 62, 221.
31. Pedio, M.; Fuggle, J. C.; Somers, J.; Umbach, E.; Haase, J.; Linder, Th.; Hofer, U.; Grioni, M.; de Groot, F. M. F.; Hillert, B.; Becker, L.; Robinson, A. Phys. Rev. B 1989, 40, 7924.
32. de Groot, F. M. F.; Grioni, M.; Fuggle, J. C.; Ghijsen, J. C.; Ghijsen, J.; Sawatzky, G. A.; Petersen, H. Phys. Rev. B 1989, 40, 5715.