SCOPUS 정보 검색 플랫폼

Journal of Electronic Materials

Volumn 38, Issue 6, 2009, Pages 787-796

Growth and characterization of Zn-incorporated copper oxide films

(5) Engin, M a Atay, F a Kose, S a Bilgin, V b Akyuz, I a

a ESKISEHIR OSMANGAZI UNIVERSITY (Turkey)

b ÇANAKKALE ONSEKIZ MART UNIVERSITY (Turkey)

Author keywords

Copper oxide films; EDS; Electrical and optical properties; Ultrasonic spray pyrolysis; XRD

Indexed keywords

ABSORBING LAYERS; BAND GAPS; DISLOCATION DENSITIES; DOPED COPPER OXIDES; EDS; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL AND STRUCTURAL PROPERTIES; ELECTRICAL CONDUCTION MECHANISMS; ELECTRICAL CONDUCTIVITY; ELEMENTAL ANALYSIS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; FILM STRUCTURE; GLASS SUBSTRATES; GRAIN SIZE; LATTICE PARAMETERS; LINEAR ABSORPTION COEFFICIENT; LOW RESISTIVITY; OPTICAL METHODS; PREFERENTIAL ORIENTATION; REFLECTION SPECTRA; SUBSTRATE TEMPERATURE; ULTRASONIC SPRAY PYROLYSIS; ULTRASONIC SPRAY PYROLYSIS TECHNIQUE; XRD;

ABSORPTION; COPPER; COPPER OXIDES; ELECTRIC CONDUCTIVITY; LIGHT; OPTICAL FILMS; OPTICAL PROPERTIES; SOLAR ENERGY; SPRAY PYROLYSIS; STRUCTURAL PROPERTIES; SUBSTRATES; ULTRASONIC TESTING; ULTRASONICS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC;

OXIDE FILMS;

EID: 67650466170 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-009-0728-0 Document Type: Conference Paper

Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.