Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): Can cryo-FIB minimize irradiation damage?

Physical Chemistry Chemical Physics

Volumn 11, Issue 25, 2009, Pages 5130-5133

  Sezen, Meltem ^a   Plank, Harald ^a   Nellen, Philipp M ^b   Meier, Stephan ^b   Chernev, Boril ^a   Grogger, Werner ^a   Fisslthaler, Evelin ^a   List, Emil J W ^a   Scherf, Ullrich ^c   Poelt, Peter ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

POLY(3 HEXYLTHIOPHENE); POLY(3-HEXYLTHIOPHENE); THIOPHENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; FREEZING; RADIATION; RAMAN SPECTROMETRY; SURFACE PROPERTY; TEMPERATURE;

FREEZING; MICROSCOPY, ATOMIC FORCE; RADIATION; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; TEMPERATURE; THIOPHENES;

EID: 67650376959     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b816893h     Document Type: Article

References (11)

1. S. P. Speakman G. G. Rozenberg K. J. Clay W. I. Milne A. Ille I. A. Gardner E. Breslerc J. H. G. Steinke Org. Electron. 2001 2 65 73
2. R. D. McCullough Adv. Mater. 1998 2 1 10
3. H. Sirringhaus N. Tessler R. H. Friend Science 1998 280 5370 1741 1744
4. T. Piok S. Gamerith C. Gadermaier H. Plank F. P. Wenzl S. Patil R. Montenegro T. Kietzke D. Neher U. Scherf K. Landfester E. J. W. List Adv. Mater. 15 10 800 804
5. J. Gierak E. Bourhis R. Jede L. Bruchhaus B. Beaumont P. Gibart Microelectron. Eng. 2004 73-74 610 614
6. J. Mansfield R. Goldman R. Laine M. Shtein Microsc. Microanal. 2005 11 2
7. C. A. Volkert A. M. Minor MRS Bull. 2007 32 389 395
8. R. F. Egerton P. Li M. Malac Micron 2004 35 399 409
9. H. Ahn D. W. Oblas J. E. Whitten Macromolecules 2004 37 3381 3387
10. T. Ishitani H. Koike T. Yaguchi T. Kamino J. Vac. Sci. Technol., B 1998 16 4 1907 1913
11. L. Frey C. Lehrer H. Ryssel Appl. Phys. A 2003 76 1017 1023