메뉴 건너뛰기




Volumn 57, Issue 14, 2009, Pages 4009-4021

Texture evolution and mechanical properties of ion-irradiated Au thin films

Author keywords

Electron backscattering diffraction; Ion beam processing; Microstructure; Nanoindentation; Thin films

Indexed keywords

AU THIN FILMS; DEFECT CLUSTER; ELECTRON BACKSCATTERING DIFFRACTION; FLUENCES; GEOMETRICALLY NECESSARY DISLOCATIONS; HALL-PETCH EFFECTS; HARDENING BEHAVIOR; HIGH ENERGY; INITIAL GRAIN SIZE; INTERFACIAL DEGRADATION; ION-BEAM PROCESSING; ION-INDUCED DEFECTS; MICRO DEVICES; MICROSTRUCTURE CHANGES; MICROSTRUCTURE CONTROL; SELECTIVE GRAIN GROWTH; TEXTURE EVOLUTIONS;

EID: 67650178219     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.04.042     Document Type: Article
Times cited : (13)

References (38)
  • 32
    • 6344258510 scopus 로고    scopus 로고
    • Jungk J.M., et al. J Mater Res 19 (2004) 2812-2821
    • (2004) J Mater Res , vol.19 , pp. 2812-2821
    • Jungk, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.