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Volumn 57, Issue 14, 2009, Pages 4009-4021
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Texture evolution and mechanical properties of ion-irradiated Au thin films
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Author keywords
Electron backscattering diffraction; Ion beam processing; Microstructure; Nanoindentation; Thin films
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Indexed keywords
AU THIN FILMS;
DEFECT CLUSTER;
ELECTRON BACKSCATTERING DIFFRACTION;
FLUENCES;
GEOMETRICALLY NECESSARY DISLOCATIONS;
HALL-PETCH EFFECTS;
HARDENING BEHAVIOR;
HIGH ENERGY;
INITIAL GRAIN SIZE;
INTERFACIAL DEGRADATION;
ION-BEAM PROCESSING;
ION-INDUCED DEFECTS;
MICRO DEVICES;
MICROSTRUCTURE CHANGES;
MICROSTRUCTURE CONTROL;
SELECTIVE GRAIN GROWTH;
TEXTURE EVOLUTIONS;
BACKSCATTERING;
CHEMICAL MODIFICATION;
DIFFRACTION;
DISLOCATIONS (CRYSTALS);
ELECTRON SCATTERING;
FATIGUE DAMAGE;
GOLD;
GRAIN SIZE AND SHAPE;
ION BEAMS;
ION BOMBARDMENT;
IONS;
MECHANICAL PROPERTIES;
NANOINDENTATION;
TEXTURES;
THIN FILMS;
GRAIN GROWTH;
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EID: 67650178219
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2009.04.042 Document Type: Article |
Times cited : (13)
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References (38)
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