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Volumn 53, Issue 11, 2005, Pages 1291-1296
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Reversible orientation-biased grain growth in thin metal films induced by a focused ion beam
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Author keywords
Channeling; Focused ion beam (FIB); Grain growth; Implantation; Thin films
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Indexed keywords
CRYSTALS;
GRAIN GROWTH;
METALLIC FILMS;
GRAIN-BOUNDARY MOBILITY;
THERMAL SPIKES;
THIN FILMS;
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EID: 24944433462
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2005.07.030 Document Type: Article |
Times cited : (29)
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References (18)
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