Characterization of photovoltage evolution of ZnO films using a scanning Kelvin probe system

Physica B: Condensed Matter

Volumn 404, Issue 16, 2009, Pages 2197-2201

  Li, W ^a   Wu, C W ^a   Qin, W G ^a   Wang, G C ^a   Lu, S Q ^a   Dong, X J ^a   Dong, H B ^a   Sun, Q L ^a  

^a NANCHANG HANGKONG UNIVERSITY   (China)

Author keywords

Kelvin probe; Photovoltage; Work function; ZnO

Indexed keywords

ELECTRONIC BEHAVIORS; ENERGY LEVEL STRUCTURES; EVOLUTION PROCESS; KELVIN PROBE; PHOTOVOLTAGE; SCANNING KELVIN PROBES; SURFACE PHOTOVOLTAGE; TIME-RESOLVED; ZNO; ZNO FILMS;

METALLIC FILMS; PROBES; SCANNING; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; SURFACE PROPERTIES; WORK FUNCTION; ZINC OXIDE;

SURFACE ANALYSIS;

EID: 67650108541     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.04.026     Document Type: Article

References (19)

1. Li S.S. Semiconductor Physical Electronics. second ed. (2006), Spring Science and Business Media
2. Reynolds D.C., Look D.C., Jogai B., Hoelscher J.E., Sherriff R.E., Harris M.T., and Callahan M.J. J. Appl. Phys. 88 (2000) 2152
3. Wang R.Z., and Jiang D.S. J. Appl. Phys. 72 (1992) 3826
4. Olivier J., Servet B., Vergnolle M., Mosca M., and Garry G. Synthetic Metals 122 (2001) 87
5. Kim J.S., Lägel B., Moons E., Johansson N., Baikie I.D., Salaneck W.R., Friend R.H., and Cacialli F. Synthetic Metals 111 (2000) 311
6. Look D.C. J. Electron. Mater. 35 (2006) 1299
7. Lee C.J., Lee T.J., Lyu S.C., Zhang Y., Ruh H., and Lee H.J. Appl. Phys. Lett. 81 (2002) 3648
8. Özgür U., Alivov Ya.I., Liu C., Teke A., Reshchikov M.A., and Doǧan S. J. Appl. Phys. 98 (2005) 041301
9. Chen X.L., Xue J.M., and Sun J. Chinese J. Semiconductors 28 (2007) 1072
10. Law M., Greene L.E., Johnson J.C., Saykally R., and Yang P.D. Nat. Mater. 4 (2005) 455
11. Minemoto T., Mizuta T., and Takakura H. Solar Energy Mater. Solar Cells 91 (2007) 191
12. Chen J., Lei W., Chai W.Q., Zhang Z.C., Li C., and Zhang X.B. Solid-State Electron. 52 (2008) 294
13. Baikie I.D., Smish P.J.S., Porterrfield D.M., and Estrup P.J. Rev. Sci. Instruments 70 (1999) 1842
14. Manual Version SKP 4.5, KP Technology Ltd, 〈www.kptechnology.ltd.uk〉.
15. Van heusden K., Warren W.L., Seager C.H., Tallant D.R., Voigt J.A., and Gnade B.E. J. Appl. Phys. 79 (1996) 7983
16. Park C.H., Zhang S.B., and Wei S.H. Phys. Rev. B 66 (2002) 073202
17. Yan Y., Zhang S.B., and Pantelides S.T. Phys. Rev. Lett. 86 (2001) 5723
18. Johnson E.Q. Phys. Rev. 111 (1958) 153
19. Klingshirn C.F. Semiconductor Optics. third ed. (2007), Springer, Berlin, Heidelberg