Use of an energy filter to improve the spatial resolution of electron backscatter diffraction

Scanning

Volumn 31, Issue 3, 2009, Pages 114-121

  Bhattacharyya, Abhishek ^a   Eades, John A ^a  

^a Lehigh University   (United States)

Author keywords

Crystallography; Electron solid interactions; Microstructure; SEM

Indexed keywords

ALUMINUM FILM; ANALYTICAL TECHNIQUES; BULK ALLOYS; CUTOFF ENERGIES; EBSD ANALYSIS; EBSD PATTERN; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON-SOLID INTERACTIONS; ENERGY FILTER; SEM; SPATIAL RESOLUTION;

ALUMINA; BACKSCATTERING; CRYSTALLOGRAPHY; ELECTRONS; GRAIN BOUNDARIES; IMAGE RESOLUTION; MICROSTRUCTURE; MINERALOGY;

ELECTRON DIFFRACTION;

ALUMINUM;

ARTICLE; CONTROLLED STUDY; ELECTRON DIFFRACTION; ENERGY; EXPERIMENTAL STUDY; FILM; FILTER; FILTER DESIGN; LIGHT SCATTERING; OPTICAL RESOLUTION; PRIORITY JOURNAL; SIGNAL DETECTION;

EID: 67650081004     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.20150     Document Type: Article

References (10)

1. Baba-Kishi KZ: Review - electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis. J Mater Sci 37, 1715-1746 (2002).
2. Deal A, Hooghan T, Eades A: Energy-filtered electron backscatter diffraction. Ultramicroscopy 108, 116-125 (2008).
3. Dingley D: Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy. J Microsc 213, 214-224 (2004).
4. Eades A, Deal A, Bhattacharyya A, Hooghan T: Energy Filtering in EBSD. In Electron Backscatter Diffraction in Materials Science, 2nd ed. (Schwartz AJ, Kumar M, Adams B L, Field DP, Eds.), Springer, Berlin (2009).
5. Humphreys FJ, Huang Y, Brough I, Harris C: Electron backscatter diffraction of grain and subgrain structures - resolution considerations. J Microsc 195, 212-216 (1999). (Pubitemid 29444732)
6. Humphreys FJ: Review - grain and subgrain characterisation by electron backscatter diffraction. J Mater Sci 36, 3833-3854 (2001).
7. Isabell TC, Dravid VP: Resolution and sensitivity of electron backscattered diffraction in a cold field emission gun SEM. Ultramicroscopy 67, 59-68 (1997). (Pubitemid 27288088)
8. Prior DJ, Boyle AP, Brenker F, Cheadle MC, Day A, et al: The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks. Am Mineralogist 84, 1741-1759 (1999). (Pubitemid 30109857)
9. Rasband WS: Image J, U.S. National Institutes of Health, Bethesda, Maryland, USA, http://rsb.info.nih.gov/ij/ (1997).
10. Schwartz AJ, Kumar M, Adams BL, Field DP. (Eds.): Energy filtering in EBSD. In Electron Backscatter Diffraction in Materials Science, 2nd ed, Springer, Berlin (2009).