Energy filtering in EBSD

Electron Backscatter Diffraction in Materials Science

Volumn , Issue , 2009, Pages 53-63

  Eades, Alwyn ^a   Deal, Andrew ^b   Bhattacharyya, Abhishek ^c   Hooghan, Tejpal ^d  

^a Lehigh University   (United States)

^b GE GLOBAL RESEARCH   (United States)

^c Texas Instruments Incorporated ^*  (United States)

^d TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSED MATTER PHYSICS; MATERIALS SCIENCE;

AUGER SPECTROSCOPY; CAMERA TECHNOLOGY; COMPUTING CAPABILITY; ELECTRON CHANNELING PATTERNS; ENERGY FILTERING; LOWER ENERGIES; POST PROCESSING; SURFACE SCIENCE;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84874577112     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-88136-2_4     Document Type: Chapter

References (17)

1. Bhattacharyya A, Eades A (2007) Use of an energy filter to improve the depth resolution of electron backscattered diffraction. Microsc Microanal 13(Suppl 2):932-933
2. Bhattacharyya A, Eades J (in press) A use of an energy filter to improve the spatial resolution of electron backscattered diffraction. Microsc Microanal
3. Broekman L, Tadich A, Huwald E, Riley J, Leckey R, Seyller T, Emtsev K, Leyb L (2005) First results from a second generation toroidal electron spectrometer. J Electron Spectrosc 144-147:1001-1004
4. Daimon H, Matsui F (2006) Two-dimensional angle-resolved photoelectron spectroscopy using display analyzer-Atomic orbital analysis and characterization of valence band. Prog Surf Sci 81:367-386
5. Deal A, Eades A (2005) Energy-dependence of an EBSD pattern. Microsc Microanal 11(Suppl 2):524-525
6. Deal A, Hooghan T, Eades A (2008) Energy-filtered electron backscatter diffraction. Ultramicroscopy 108:116-125
7. rd ed. Kluwer, New York
8. Hirsch PB, Howie A, Nicholson RB, Pashley DW, Whelan MJ (1977) Electron microscopy of thin crystals. Krieger, New York (reprinted)
9. Hooghan TK, Staib P, Eades A (2004) An energy filter for electron backscattering diffraction. Microsc Microanal 10(Suppl 2):938-939
10. Joy DC (2002) SMART-A program to measure SEM resolution and imaging performance. J Microsc 208:24-34
11. Mancuso JF, Fama LA, Maxwell WB (1994) Effect of energy filtering on micro-diffraction in the SEM. Proceedings of the microscopy society of America, pp 604-605
12. Pronin II, Gomoyunova MV (1998) Imaging of near-surface atomic structure by forward-focused backscattered electrons. Prog Surf Sci 59:53-65
13. Staib Instruments (2008), http://www.staibinstruments.com
14. Van Hove MA, Weinberg WH, Chan CM (1986) Low-energy electron diffraction: experiment, theory, and surface structure determination. Springer-Verlag, Berlin
15. Wells OC (1999) Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope. Scanning 21:368-371
16. Went MR, Winkelmann A, Vos M (in press) Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer. Ultramicroscopy
17. Williams DB, Carter CB (1996) Transmission electron microscopy. Plenum, New York