메뉴 건너뛰기




Volumn 111, Issue 1, 2008, Pages 114-120

Influence of the annealing in nitrogen atmosphere on the XRD, EDX, SEM and electrical properties of chemical bath deposited CdSe thin films

Author keywords

Annealing; Electrical properties; SEM; Thin film

Indexed keywords

ANNEALING; CADMIUM COMPOUNDS; ELECTRIC CONDUCTIVITY; NANOCRYSTALLINE MATERIALS; NITROGEN;

EID: 44249125951     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.03.021     Document Type: Article
Times cited : (116)

References (33)
  • 29
    • 44249084787 scopus 로고    scopus 로고
    • JPDS Files No.: 08-459 and 19-191.
    • JPDS Files No.: 08-459 and 19-191.
  • 32
    • 84919215859 scopus 로고
    • Measurement of sheet resistivities with the four-point probe
    • Smits F.M. Measurement of sheet resistivities with the four-point probe. Bell Syst. Tech. J. (1958) 711-718
    • (1958) Bell Syst. Tech. J. , pp. 711-718
    • Smits, F.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.