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Volumn 42, Issue 4, 2009, Pages

Resistive switching properties and low resistance state relaxation in Al/Pr0.7Ca0.3MnO3/Pt junctions

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-RESISTANCE STATE; HIGH-TO-LOW; INSULATOR LAYER; JUNCTION RESISTANCES; LOW-RESISTANCE STATE; NEGATIVE DIFFERENTIAL RESISTANCES; NEGATIVE PULSE; PLATINIZED SILICON SUBSTRATES; PULSE DURATIONS; PULSE SWITCHING; RESISTANCE VALUES; RESISTIVE SWITCHING; STABLE PROCESS;

EID: 67650044806     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/4/045411     Document Type: Article
Times cited : (35)

References (19)
  • 1
    • 35748974883 scopus 로고    scopus 로고
    • Nanoionics-based resistive switching memories
    • DOI 10.1038/nmat2023, PII NMAT2023
    • Waser R and Aono M 2007 Nanoionics-based resistive switching memories Nature Mater. 6 833-40 (Pubitemid 350064191)
    • (2007) Nature Materials , vol.6 , Issue.11 , pp. 833-840
    • Waser, R.1    Aono, M.2
  • 2
    • 50249152925 scopus 로고    scopus 로고
    • 2-stack 1D-1R cross-point structure with oxide diodes as switch elements for high density resistance ram applications
    • Lee M-J et al 2007 2-stack 1D-1R cross-point structure with oxide diodes as switch elements for high density resistance ram applications Tech. Dig.-Int. Electron Devices Meeting pp 771-4
    • (2007) Tech. Dig.-Int. Electron Devices Meeting , pp. 771-774
    • Lee, M.-J.1    Al, E.2
  • 3
    • 50249156872 scopus 로고    scopus 로고
    • Low power and high speed switching of Ti-doped NiO ReRAM under the unipolar voltage source of less than 3 v
    • Tsunoda K et al 2007 Low power and high speed switching of Ti-doped NiO ReRAM under the unipolar voltage source of less than 3 V Tech. Dig.-Int. Electron Devices Meeting pp 767-70
    • (2007) Tech. Dig.-Int. Electron Devices Meeting , pp. 767-770
    • Tsunoda, K.1    Al, E.2
  • 11
    • 34147108217 scopus 로고    scopus 로고
    • Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides
    • Nian Y B, Strozier J, Wu N J, Chen X and Ignatiev A 2007 Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides Phys. Rev. Lett. 98 146403
    • (2007) Phys. Rev. Lett. , vol.98 , Issue.14 , pp. 146403
    • Nian, Y.B.1    Strozier, J.2    Wu, N.J.3    Chen, X.4    Ignatiev, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.