Degradation of LaMnO3-y surface layer in LaMnO 3-y/metal interface

Applied Physics Letters

Volumn 81, Issue 5, 2002, Pages 859-861

  Plecenik, A ^a   Frohlich K ^a   Espinos J P ^b   Holgado, J P ^b   Halabica, A ^a   Pripko, M ^a   Gilabert, A ^c  

^a INSTITUTE OF ELECTRICAL ENGINEERING   (Slovakia)

^b CSIC JA USE Centro de Investigaciones Cientificas Isla de la Cartuja CICIC   (Spain)

^c UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION PROCESS; ELECTRICAL MEASUREMENT; INTERFACE LAYER; JUNCTION RESISTANCES; METAL INTERFACE; NORMAL METALS; OUT-DIFFUSION; SURFACE LAYERS; TEMPERATURE DEPENDENCE; TIME EVOLUTIONS; XPS MEASUREMENTS;

DEGRADATION; MANGANESE OXIDE; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; SEMICONDUCTOR INSULATOR BOUNDARIES;

METALS;

EID: 79955995534     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1497439     Document Type: Article

References (12)

1. J.-H. Park, E. Vescovo, H.-J. Kim, C. Kwon, R. Ramesh, and T. Venkatesan, Phys. Rev. Lett. 81, 1953 (1998). prl PRLTAO 0031-9007
2. L. Mieville, D. Worledge, T. H. Geballe, R. Contreras, and K. Char, Appl. Phys. Lett. 73, 1736 (1998). apl APPLAB 0003-6951
3. J. M. de Teresa, A. Barthélémy, J. P. Contour, and A. Fert, J. Magn. Magn. Mater. 211, 160 (2000). jmm JMMMDC 0304-8853
4. C. N. Borca, B. Xu, T. Komesu, H.-K. Jeong, M. T. Liu, S.-H. Liou, S. Stadler, Y. Idzerda, and P. A. Dowben, Europhys. Lett. 56, 722 (2001). eul EULEEJ 0295-5075
5. P. A. Dulli, E. W. Plummer, P. A. Dowben, J. Choi, and S.-H. Liou, Appl. Phys. Lett. 77, 570 (2000). apl APPLAB 0003-6951
6. A. Gilabert, A. Plecenik, K. Frohlich, S. Gazi, M. Pripko, Z. Mozolova, D. Machajdik, S. Benacka, and M. G. Medici, Appl. Phys. Lett. 78, 1712 (2001). apl APPLAB 0003-6951
7. K. Frohlich, J. Souc, D. Machajdik, A. P. Kobzev, F. Weiss, J. P. Senateur, and K. H. Dahmen, J. Phys. IV C5, 533 (1995). jpv JPICEI 1155-4339
8. J. Choi, J. Zhang, S.-H. Liou, P. A. Dowben, and E. W. Plummer, Phys. Rev. B 59, 13453 (1999). prb PRBMDO 0163-1829
9. M. Grajcar, A. Plecenik, S. Benacka, Ju. Revenko, and V. M. Svistunov, Physica C 218, 82 (1993). phc PHYCE6 0921-4534
10. T. J. Regan, H. Ohldag, C. Stamm, F. Nolting, J. Lüning, J. Stöhr, and R. L. White, Phys. Rev. B 64, 214422 (2001). prb PRBMDO 0163-1829
11. A. M. De Leon-Guevara, P. Berthet, J. Berthon, F. Millot, R. Revcolevschi, A. Anane, C. Dupas, K. Le Dang, J. P. Renard, and P. Veillet, Phys. Rev. B 56, 6031 (1997). prb PRBMDO 0163-1829
12. T. Saitoh, A. E. Bocquet, T. Mizokawa, H. Namatame, A. Fujimori, M. Abbate, Y. Takeda, and M. Takano, Phys. Rev. B 51, 13942 (1995). prb PRBMDO 0163-1829