Probing negative differential resistance on Si (111) -3×3-Ag surface with scanning tunneling microscopy

Applied Physics Letters

Volumn 94, Issue 26, 2009, Pages

  Wang, Weihua ^a   Zhao, Aidi ^a   Wang, Bing ^a   Hou, J G ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT; NEGATIVE DIFFERENTIAL RESISTANCES; SI (1 1 1); SI SUBSTRATES; SPACE CHARGE LAYERS; SURFACE STATE; SURFACE STATE BANDS;

NEGATIVE RESISTANCE; SCANNING; SCANNING TUNNELING MICROSCOPY; SILVER;

SILICON;

EID: 67649998688     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3173821     Document Type: Article

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