On thermodynamic reliability engineering

IEEE Transactions on Reliability

Volumn 49, Issue 2, 2000, Pages 136-146

  Feinberg, Alec A ^a,b   Widom, Allan ^a,b  

^a M/A COM   (United States)

^b NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ENTROPY; FREE ENERGY; MATHEMATICAL MODELS; MICROELECTRONICS; THERMAL DIFFUSION; THERMODYNAMICS;

ARRHENIUS MECHANISM; NONEQUILIBRIUM THERMODYNAMICS; RATE CONTROLLING PROCESS; THERMAL ACTIVATION; THERMODYNAMIC RELIABILITY ENGINEERING; TIME COMPRESSION EQUATIONS;

RELIABILITY THEORY;

EID: 0034197705     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2000.877330     Document Type: Article

References (13)

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2. _, "Aspects of the thermodynamic aging process in reliability physics," Inst. Environmental Sciences Proc., vol. 49, May 1995.
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4. D. Linden, Ed., Handbook of Batteries and Fuel Cells: McGraw Hill, 1980, pp. 1-21.
5. M. G. Fontana and N. D. Greene, Corrosion Engineering: McGraw-Hill, 1978, p. 356.
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10. _, "The reliability physics of thermodynamic aging," in Recent Advances in Life-Testing and Reliability, N. Balakrishnan, Ed: CRC Press, 1995.
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13. A. A. Feinberg, P. Ersland, V. Kaper, and A. Widom, "On aging of key transistor device parameters," in Proc. Inst. Environmental Sciences & Technology, 2000, pp. 231-236.