Element-specific profiling for icf ablator capsules with mixed dopant and impurities

Fusion Science and Technology

Volumn 55, Issue 4, 2009, Pages 356-366

  Huang, H ^a   Nikroo, A ^a   Stephens, R B ^a   Eddinger, S A ^a   Wall, D R ^a   Moreno, K A ^a   Xu, H W ^a  

^a GENERAL ATOMICS   (United States)

Author keywords

Differential radiography; Dopant profile; Energy dispersive spectroscopy

Indexed keywords

BERYLLIUM; CALIBRATION; CHEMICAL ELEMENTS; COPPER; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; OXYGEN; RADIOGRAPHY; SHELLS (STRUCTURES); SPECIFICATIONS; X RAY ABSORPTION; X RAY TUBES;

DIFFERENTIAL RESPONSE; DOPANT PROFILE; EDS MEASUREMENTS; ENERGY DISPERSIVE SPECTROSCOPIES (EDS); LOW CONCENTRATIONS; NATIONAL IGNITION FACILITY; PRODUCTION METROLOGY; PRODUCTION WORKFLOWS;

X RAY RADIOGRAPHY;

EID: 67649550224     PISSN: 15361055     EISSN: None     Source Type: Journal    
DOI: 10.13182/FST55-356     Document Type: Article

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