Nondestructive quantitative dopant profiling technique by contact radiography

Fusion Science and Technology

Volumn 49, Issue 4, 2006, Pages 650-656

  Huang, H ^a   Stephens, R B ^a   Eddinger, S A ^a   Gunther, J ^b   Nikroo, A ^a   Chen, K C ^a   Xu, H W ^a  

^a GENERAL ATOMICS   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ELECTRON MICROSCOPES; FLUORESCENCE; IGNITION SYSTEMS; RADIOGRAPHY; SHELLS (STRUCTURES); SPECIFICATIONS;

CONTACT RADIOGRAPHY; DOPANT PROFILING; DOPANT SIMULATION MODEL; RADIAL DISTRIBUTION;

INERTIAL CONFINEMENT FUSION;

EID: 33745023375     PISSN: 15361055     EISSN: None     Source Type: Journal    
DOI: 10.13182/FST49-650     Document Type: Conference Paper

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